Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Variable-temperature spectrum testing device

A spectrum testing and temperature control device technology, applied in the field of optical measurement, can solve problems such as large testing requirements, and achieve the effects of improving testing speed, accurate measurement results, and simple structure

Pending Publication Date: 2020-06-16
SHANGHAI INST OF TECH +1
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At the same time, the test requirements under low temperature and variable temperature conditions are relatively large

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Variable-temperature spectrum testing device
  • Variable-temperature spectrum testing device
  • Variable-temperature spectrum testing device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0038] see Figure 1 to Figure 6 As shown, the present invention provides a kind of variable temperature spectrum testing device, comprises operating system 1, variable temperature system 2, measurement system 3, cooling system 4 and analysis system (not shown in the figure);

[0039] The operating system 1 includes a system console 11 and a data transmission line 12. The system console 11 is used to set the test temperature. In this embodiment, the range of the test temperature set by the system console 11 is -30°C to 150°C. The input end is connected with the system console 11, and the data transmission line 12 is used to transmit the test temperature data set by the system console 11;

[0040] see Figure 5 As shown, the variable temperature system 2 includes a variable temperature stage 21 and a temperature control device (because the temperature control device is arranged inside the temperature variable system 2, it is not shown in the figure), and the variable temperatu...

Embodiment 2

[0050] The optical performance parameters of the temperature-variable optical material are tested by using a temperature-variable spectrum testing device provided in Embodiment 1, and the steps are as follows:

[0051] 1) Weigh 100 mg of YAG yellow fluorescent powder and evenly spread it on the variable temperature stage 21;

[0052] 2) The measurement temperature is set through the system console 11, the measurement temperature is set to -10°C, the semiconductor refrigerating sheet of the semiconductor thermoelectric cooling chip works, and the variable temperature stage 21 is controlled to cool down to -10°C;

[0053] 3) Push the variable temperature stage 21 to the lower end of the integrating sphere 31, and close the integrating sphere 31 after the temperature of the variable temperature stage 21 is stable;

[0054] 4) Turn on the COB blue light source, whose excitation wavelength is 450nm;

[0055] 5) Turn on the computer for measurement, and the measured result is: the ...

Embodiment 3

[0059] The optical performance parameters of the temperature-variable optical material are tested by using a temperature-variable spectrum testing device provided in Embodiment 1, and the steps are as follows:

[0060] 1) Prepare a fluorescent film with a thickness of 2 mm and evenly spread it on the variable temperature stage 21;

[0061] 2) The measurement temperature is set through the system console 11, the measurement temperature is set to -10°C, the semiconductor refrigerating sheet of the semiconductor thermoelectric cooling chip works, and the variable temperature stage 21 is controlled to cool down to -10°C;

[0062] 3) Push the variable temperature stage 21 to the lower end of the integrating sphere 31, and close the integrating sphere 31 after the temperature of the variable temperature stage 21 is stable;

[0063] 4) Turn on the COB blue light source, whose excitation wavelength is 450nm;

[0064] 5) Turn on the computer for measurement, and the measured result is...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
Beam angleaaaaaaaaaa
Radius sizeaaaaaaaaaa
Login to View More

Abstract

The invention discloses a variable-temperature spectrum testing device. The variable-temperature spectrum testing device comprises an operating system, a temperature changing system, a measuring system, a cooling system and an analyzing system, wherein the operating system is used for setting a test temperature; the test temperature is transmitted to a temperature control device in the temperaturechanging system through a data transmission line; the temperature control device controls the temperature of a variable-temperature objective table according to the test temperature; and after the temperature of the variable-temperature objective table on which the test sample is placed is stable, an integrating sphere is closed for measurement, and a probe transmits received light emitted by thetest sample and a light signal generated by the excitation light source exciting the sample to the analysis system to obtain optical performance parameters of the test sample at different temperatures.

Description

technical field [0001] The invention belongs to the technical field of optical measurement, in particular to a variable temperature spectrum testing device. Background technique [0002] In recent years, with the vigorous development of semiconductor LED lighting, lighting and other fields, high-performance solid-state light-emitting materials have attracted extensive attention in high-end technology fields such as information technology, new materials and new energy. At present, from the perspective of basic research, the routine testing of solid-state luminescent materials can no longer meet the needs of researchers for material performance evaluation. For example, under the conditions of high temperature 150° or low temperature -30°, some special physical and chemical Phenomenon. On the other hand, in the field of engineering technology applications, the physical properties of luminescent materials are often affected by external operating conditions, so it is necessary t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N21/64G01N21/25G05D23/20
CPCG01N21/25G01N21/64G05D23/20
Inventor 王伟邹军石明明王金瑞
Owner SHANGHAI INST OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com