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Test planning system and method based on hypercube topological structure in network-on-chip

A topology, hypercube technology, applied in transmission systems, digital transmission systems, data exchange networks, etc., can solve the problems of low test efficiency and long time, so as to solve the problems of low test efficiency, reduce test time, and reduce test time. cost effect

Active Publication Date: 2020-06-19
GUILIN UNIV OF ELECTRONIC TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a test planning system and method based on a hypercube topology in an on-chip network, aiming to solve the problem of low test efficiency caused by the long time spent in the process of testing the on-chip network using traditional structural algorithms

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Embodiment Construction

[0040] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0041] In describing the present invention, it should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", The orientation or positional relationship indicated by "horizontal", "top", "bottom", "inner", "outer", etc. are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than Nothing indicating or implying that a referenced device or element...

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Abstract

The invention discloses a test planning system and method based on a hypercube topological structure in a network-on-chip. The system comprises an IP core extraction module, an IP core coding module,an input port distribution module, a path algorithm module, an output port distribution module and a data analysis module. The IP core extraction module is used for extracting a test IP core in the circuit to be tested and parameters required by the test; an IP core is coded and mapped by a hypercube structure through an IP core coding module; a test vector is distributed to a specified port by the input port distribution module, then the path algorithm module plans a path by using an E-cube algorithm with partial adaptive capacity and tests an IP core, and a test result is planned by the E-cube algorithm with partial adaptive capacity and sent to the output port distribution module. By reducing the number of routers passed in the test process, the distance between IP cores and the diversity of routing node selection in the data transmission process, the test time of the IP cores is reduced, and the test efficiency is improved.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a test planning system and method based on a hypercube topology in an on-chip network. Background technique [0002] The specific test process of the on-chip network is as follows: first, the test vector enters the topology structure from the input port, is transmitted to the IP core to be tested by a certain routing strategy and waits for the test to be completed, and then the test response of the IP core passes through the topology structure again with a certain routing algorithm Transfer to output port for analysis. [0003] The topology reflects the connection and layout of communication nodes, which will affect the communication delay and network throughput of the network on chip; the routing algorithm determines the transmission path of the message in the network, and a good routing algorithm can improve the performance of the interconnection network. At present, ...

Claims

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Application Information

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IPC IPC(8): H04L12/26H04L12/721H04L12/751H04L45/02
CPCH04L43/50H04L45/02H04L45/14
Inventor 胡聪信文雪周甜朱爱军许川佩梁志勋黄喜军
Owner GUILIN UNIV OF ELECTRONIC TECH
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