Rare earth sample sequential ionization analysis method
An analysis method and rare earth ion technology, applied in the field of rare earth analysis, can solve the problems of many analysis steps and long analysis time.
Pending Publication Date: 2020-07-07
EAST CHINA UNIV OF TECH
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Problems solved by technology
[0005] For this reason, the object of the present invention is to propose a method for sequential ionization analysis of rare earth samples to solve the problems of complex sample pretreatment, many analysis steps, and long analysis time in the prior art
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[0033] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and understandable, the specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings. Several embodiments of the invention are shown in the drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thorough and comprehensive.
[0034] It should be noted that when an element is referred to as being "fixed to" another element, it can be directly on the other element or a central element may also exist. When an element is considered to be "connected" to another element, it can be directly connected to the other element or an intermediate element may be present at the same time. The terms "vertical", "horizontal"...
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The invention discloses a rare earth sample sequential ionization analysis method, and the method comprises: placing a to-be-analyzed rare earth sample into a sequential elution device, wherein one end of the sequential elution device is a sample introduction end, the other end is a sample discharge end, and the sample introduction end is connected to a peristaltic pump, and the sample discharge end is connected to an ICP-MS atomizer; sequentially inputting H2O, NH4AC, NH2OH-HCl, HNO3 and H2O2 and HF and HNO3 into the sequential elution device through the peristaltic pump; after the reagents react with the rare earth samples in sequence, enabling the reagents to flow into ICP-MS for detection, and achieving the sequential ionization analysis of the rare earth samples, and obtaining rare earth information of different forms in the rare earth samples. The method has the advantages that samples do not need to be pretreated, the analysis steps are few, the analysis time consumption is short, the sample consumption is small, the reagent consumption is small, and the data information is rich. In addition, the method does not need to use an expensive laser source, and the cost is lower.
Description
Technical field [0001] The invention relates to the technical field of rare earth analysis, in particular to a method for sequential ionization analysis of rare earth samples. Background technique [0002] Rare earth elements refer to 15 kinds of lanthanide elements and a total of 17 kinds of metal elements of scandium and yttrium. Due to the unique properties of these elements, they have been used in many high-tech industries, such as electronic information, communications, and national defense. The field and energy field are an important strategic resource. At present, the global annual consumption of rare earths is 210,000 tons, and the total amount of proven rare earth reserves is 120 million tons. Therefore, as a non-renewable resource, improving the efficiency of rare earth mining is of great significance to the global rare earth industry. [0003] However, different types of rare earth mines require different mining technologies. For example, ion-type rare earths are gener...
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Login to View More IPC IPC(8): G01N30/02G01N30/06G01N30/72
CPCG01N30/02G01N30/06G01N30/72G01N2030/062G01N2030/065
Inventor 李发亮徐加泉朱腾高吴德波陈焕文
Owner EAST CHINA UNIV OF TECH