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Integrating sphere photometer spectral response measurement method and system

A technology of spectral response and measurement method, which is applied in the field of spectral response measurement of integrating sphere photometer, can solve the problems of increasing the complexity of measurement and correction, the sensitivity of the integrating sphere photometer system cannot be reached, and the economic cost is not suitable for industrial applications, etc.

Pending Publication Date: 2020-07-24
HANGZHOU EVERFINE PHOTO E INFO
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This type of method has high requirements on the laboratory environment and equipment, and is not suitable for industrial applications in terms of economic cost and other considerations.
In addition, if the integrating sphere photometer system is regarded as a whole, the sensitivity of the integrating sphere photometer system may not be as high as compared with the reference detector with traceable spectral responsivity using the above spectral comparison device, and it will also increase the complexity of measurement correction

Method used

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  • Integrating sphere photometer spectral response measurement method and system
  • Integrating sphere photometer spectral response measurement method and system
  • Integrating sphere photometer spectral response measurement method and system

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Embodiment 1

[0040] An embodiment of an integrating sphere photometer spectral response measurement system provided by the present invention, such as figure 1 , as shown in 2, comprising: LED light source 4-1, integrating sphere 1, broadband photodetector 2 is arranged on the wall of integrating sphere 1, and incident window 3 is also provided on integrating sphere 1, and LED light source 4-1 can successively emit three Rays of one or more specified wavelength bands.

[0041] The method for measuring spectral response of an integrating sphere photometer comprises the following steps:

[0042] (1) The LED light source 4-1 emits three or more specified bands of light with overlapping spectra;

[0043] (2) Obtain the spectral radiant flux P of the light emitted by the LED light source 4-1 in advance i (λ)(i=1,2,...n);

[0044] (3) The light emitted by the LED light source 4-1 in turn enters the integrating sphere 1 through the incident window 3;

[0045] (4) Obtain the photometric value M...

Embodiment 2

[0049] An embodiment of an integrating sphere photometer spectral response measurement system provided by the present invention, such as figure 1 , 3, compared with Embodiment 1, the light source is an integrating spherical surface light source 4-3, and a detachable spectroradiometer 8 is provided on the light emitting surface of the surface light source.

[0050] The method for measuring spectral response of an integrating sphere photometer comprises the following steps:

[0051] (1) Integrating spherical light source 4-3 emits three or more specified bands of light with overlapping spectra through adjustment;

[0052] (2) The detachable radiometer located on the light exit surface of the integrating spherical light source 4-3 is used to obtain the spectral radiant flux P of the light emitted by the integrating spherical light source 4-3 i (λ)(i=1,2,...n);

[0053] (3) The light emitted by the integrating sphere light source 4-3 enters the integrating sphere 1 through the i...

Embodiment 3

[0058] An embodiment of an integrating sphere photometer spectral response measurement system provided by the present invention, such as figure 1 , shown in 4, compared with embodiment one, increased spectral measurement window 7 and spectroradiometer 8, spectral measurement window 7 is arranged on integrating sphere 1 wall, and the receiving end of spectroradiometer 8 is arranged on spectral measurement window 3 .

[0059] The method for measuring spectral response of an integrating sphere photometer comprises the following steps:

[0060] (1) The LED light source 4-1 emits three or more specified bands of light with overlapping spectra;

[0061] (2) The light rays sequentially emitted by the light source module 4-1 are incident into the integrating sphere 1;

[0062] (3) Obtain the photometric value M of the mixed light in the integrating sphere 1 through the broadband photodetector 2 i (i=1,2,...n);

[0063] (4) Obtain the spectral radiant flux P of the light emitted by...

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Abstract

The invention discloses an integrating sphere photometer spectral response measurement method and system. The system comprises an integrating sphere photometer and three or more reference light sources with different peak wavelengths, the integrating sphere photometer is composed of an integrating sphere and a broadband photodetector, and the broadband photodetector is installed on the sphere wallof the integrating sphere. Emergent light of the reference light sources enters the integrating sphere, the total spectral radiation flux Pi (lambda) (i =1, 2, ... n) received by the integrating sphere photometer system is acquired, the response Mi (i = 1, 2, ... n) of a photometer of mixed light in the integrating sphere is read through the broadband photodetector, an equation set is established, and the spectral responsivity Srel (lambda) of the integrating sphere photometer is obtained through numerical solution.

Description

technical field [0001] The invention relates to the field of photoelectric testing, in particular to a method and system for measuring spectral response of an integrating sphere photometer. Background technique [0002] Integrating sphere spectrometers and integrating sphere photometers are commonly used photometric measurement devices. Among them, integrating sphere photometers have unique application advantages in the field of weak light measurement due to their high sensitivity and large linear dynamic range, especially for micro LEDs. And low-light products such as Mini LED measurement. [0003] Integrating sphere photometers usually have spectral mismatch errors when measuring photometric values, especially for the measurement of narrow-band light sources, the measurement errors caused by spectral mismatch are very large. Therefore, it is necessary to evaluate and correct for the spectral mismatch error of the integrating sphere photometer system, which is also recomme...

Claims

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Application Information

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IPC IPC(8): G01J3/28G01J3/02G01J1/16G01J1/02G01M11/02
CPCG01J1/0295G01J1/16G01J3/0297G01J3/2803G01M11/02
Inventor 潘建根黄艳毛之江李倩
Owner HANGZHOU EVERFINE PHOTO E INFO
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