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Photothermal detector, system and preparation method

A detector and photothermal technology, which is applied in the field of photothermal detection, can solve the problems of low sensitivity, low accuracy, and inaccurate light intensity measurement of light intensity, so as to increase the charge transfer rate, increase the transfer rate, and improve the measurement results. accurate effect

Inactive Publication Date: 2020-08-11
金华伏安光电科技有限公司
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  • Abstract
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Problems solved by technology

[0005] The purpose of the present invention is to provide a photothermal detector, system and preparation method for the above-mentioned deficiencies in the prior art to solve the problem of measuring the total number of photons N in the prior art and the general measurement problem due to the influence of the prior art. The accuracy of photons is not high, which in turn makes the obtained light intensity inaccurate, and the problem of low sensitivity to light intensity measurement

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  • Photothermal detector, system and preparation method
  • Photothermal detector, system and preparation method
  • Photothermal detector, system and preparation method

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Embodiment Construction

[0031] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is an embodiment of the metal plate of the present invention, but not all embodiments. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations.

[0032] Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in...

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Abstract

The invention relates to a photo-thermal detector, a system and a preparation method, and mainly relates to the technical field of photo-thermal detection. According to the invention, a plurality of conical holes are formed in the metal layer; under the action of a tip effect, a large amount of charges can be gathered at the tip of the conical cavity; the molybdenum disulfide layer has excellent carrier mobility; meanwhile, molybdenum disulfide laminated metal particles are coupled; the electron transfer speed in the molybdenum disulfide layer is accelerated; the metal particles are arranged at the bottom of the molybdenum disulfide; molybdenum disulfide has ultrathin physical properties. The contact area of the molybdenum disulfide layer and the metal unit is further increased; the chargetransfer rate is further increased, the measurement result is more accurate when the photothermal detector detects the light intensity according to the relation between photothermoelectricity, and due to the fact that the charge transfer rate of the photothermal detector is greatly increased, the photothermal measurement sensitivity is high.

Description

technical field [0001] The invention relates to the technical field of photothermal detection, and mainly relates to a photothermal detector, a system and a preparation method. Background technique [0002] The photothermal effect refers to the electrical characteristics of the material change caused by the temperature change. The photothermal detector is used to obtain the light intensity of the light to be measured by detecting the heat generated by the light through the relationship between light and heat. [0003] In the prior art, the measurement of light intensity is calculated by the formula, I=Nhv / At, wherein, I represents the light intensity in the optics, v represents the frequency of light, A is the area of ​​the irradiation area, and N is the time interval t The total number of photons that hit A. [0004] However, the above calculation method needs to measure the total number of photons N, and due to the influence of the existing technology, the accuracy of mea...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L35/14H01L35/22H01L35/34H10N10/851H10N10/01H10N10/855
CPCH10N10/851H10N10/855H10N10/01
Inventor 不公告发明人
Owner 金华伏安光电科技有限公司