Signal testing method, system and device and readable storage medium

Abstract

The invention discloses a signal testing method, which comprises the following steps: starting a script program to control a CPU (Central Processing Unit) of a corresponding board card, so that the power consumption of the CPU is dynamically changed; carrying out sending end test and receiving end test on the board card in the current CPU state, and obtaining a corresponding first test result, wherein the first test result comprises eye height test data and eye width test data. The power consumption of the CPU is controlled to dynamically change by using the script program, namely, a test environment of the dynamic noise of the power supply is provided for the board card signal, the first test result obtained in the test environment can obviously reflect the influence of the dynamic noiseof the power supply on the signal quality, and a reliable basis is provided for product quality and design optimization. Correspondingly, the invention further discloses a signal testing system and device with the same beneficial effects and a readable storage medium.

Description

technical field [0001] The invention relates to the field of circuit design and testing, in particular to a signal testing method, system, device and readable storage medium. Background technique [0002] With the rapid development of computer technology, the signal data transmission rate of PCIe (peripheral component interconnect express, bus and interface standard), which is the main interface for peripheral interconnection, continues to increase, and its signal integrity risk in complex board-level systems also increases. . Therefore, PCIe signal integrity testing has become an essential item for high-end electronic products such as servers or switches. And in the PCB (Printed Circuit Board, printed circuit board) design process, due to the high density of the board and the limited wiring space, the PCIe signal wiring will inevitably be close to or pass through the switching power supply area. Consider the detrimental effect of power supply noise on the signal. [0003...

AI Technical Summary

Problems solved by technology

[0003] There are two current PCIe test methods. One is based on the PCIe signal integrity test performed by the CPU in an ideal or low power consumption state. This method cannot cover the impact of power supply dynamic noise on signal quality, and can only pass later performance tests. To identify the design risk, which leads to the extension of the product development cycle; another test method is to simply test the influence of power supply noise on the PCIe signal. power signal

However, the unit noise is basically the same on the differential signal lines P and N. After the difference operation is performed at the receiving end, the actual impact of the power supply noise on the PCIe signal becomes less obvious. Therefore, this method also cannot directly characterize the influence of the power supply noise on the PCIe signal. the strength of

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