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Dual-protection circuit for atomic chip

A protection circuit and double protection technology, which is applied to emergency protection circuit devices, emergency protection circuit devices for limiting overcurrent/overvoltage, circuit devices, etc., can solve problems such as chip micro wire fusing, and achieve low cost and reliability The effect of high performance and simple structure

Active Publication Date: 2020-08-21
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, when the control system fails, for example, the computer crashes during operation or the relevant board fails, it may generate a current output exceeding the maximum allowable continuous working time, which will cause the chip microwire to fuse

Method used

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  • Dual-protection circuit for atomic chip
  • Dual-protection circuit for atomic chip
  • Dual-protection circuit for atomic chip

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Comparison scheme
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Embodiment Construction

[0018] The present invention will be further described below with reference to the drawings and specific embodiments, but it does not mean to limit the protection scope of the present invention.

[0019] Such as figure 1 As shown, a dual protection circuit for an atomic chip includes: a first-level protection circuit ( figure 1 In the first relay control circuit 2, ordinary relay 3) and the second protection circuit ( figure 1 First hysteresis comparator 6, integrating circuit 7, second hysteresis comparator 8, second relay control circuit 9, magnetic attraction relay 10); digital photocoupler 1, Zener diode 5, chip wire terminal 4. Siren 11. The input end of the first-level protection circuit is connected to the output end of the digital photocoupler 1, and the output end of the first-level protection circuit is connected to the chip wire terminal 4; the input end of the second-level protection circuit is connected to the digital The output end of the type photocoupler 1, ...

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PUM

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Abstract

The invention discloses a dual-protection circuit for an atomic chip. The dual-protection circuit comprises a first-stage protection circuit, a second-stage protection circuit, a digital photoelectriccoupler, a voltage stabilizing diode, a chip conducting wire binding post and an alarm, wherein the input end of the first-stage protection circuit is connected with the output end of the digital photoelectric coupler, the output end of the first-stage protection circuit is connected with the chip conducting wire binding post, the input end of the second-stage protection circuit is connected withthe output end of the digital photoelectric coupler, and the output end of the second-stage protection circuit is connected with the chip conducting wire binding post and the alarm. According to theinvention, the protection circuit is simple in structure and high in reliability, and the conduction time can be limited when a power supply or a control program of the chip conducting wire breaks down, so that the micro conducting wire on the chip can be protected.

Description

technical field [0001] The invention relates to an atomic chip, more precisely, a protection circuit for protecting micro wires on the atomic chip, and belongs to the technical field of cold atom physics experiment devices. Background technique [0002] The atom chip developed since the beginning of this century is an integrated experimental device for preparing ultracold atoms, which is widely used in the research of atomic interference, low-dimensional quantum gas, quantum dynamics and quantum thermodynamics. The magnetic field generated by passing electric current through the tiny wires of the atom chip is used for the trapping and manipulation of atoms. The width of the microwire on the atomic chip is usually on the order of 100 microns, and the thickness is usually no more than 5 microns, so the current carrying capacity is limited. The rated current is usually less than 5 amps, and the continuous working time usually needs to be limited to less than 10 seconds. This ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H02H7/20H02H11/00H02H9/02
CPCH02H7/20H02H11/006H02H9/02
Inventor 周蜀渝巩冬梅王颖
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI