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Abnormal construction method and device of storage equipment, electronic equipment and storage medium

A storage device and abnormal structure technology, which is applied in the computer field, can solve problems such as time-consuming, inaccurate abnormal structure, and storage device type restrictions, and achieve a fast effect

Active Publication Date: 2020-09-22
BAIDU ONLINE NETWORK TECH (BEIJIBG) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Embodiments of the present invention provide an abnormal construction method, device, electronic equipment, and storage medium of a storage device, so as to solve technical problems such as time-consuming, limited by the type of storage device, and inaccurate abnormal structure in the prior art when constructing an abnormality.

Method used

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  • Abnormal construction method and device of storage equipment, electronic equipment and storage medium
  • Abnormal construction method and device of storage equipment, electronic equipment and storage medium
  • Abnormal construction method and device of storage equipment, electronic equipment and storage medium

Examples

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Embodiment 1

[0028] figure 1 It is a flow chart of a storage device exception construction method provided by Embodiment 1 of the present invention. This embodiment is applicable to the case of constructing storage device exceptions when testing a distributed storage system. This method can be implemented by the corresponding storage device Executed by an abnormal construction device, which can be implemented in the form of software and / or hardware, and can be configured on electronic equipment, such as a computer terminal or server.

[0029] Such as figure 1 As shown, the abnormal construction method of the storage device provided in the embodiment of the present invention may include:

[0030] S110. Responding to the call of the program under test to the target rewriting operation function in the preloaded library, acquire an abnormal parameter of the storage device.

[0031] Wherein, the program under test refers to any program in the system under test, and the system under test may b...

Embodiment 2

[0050] figure 2 It is a schematic flowchart of a storage device exception construction method provided by Embodiment 2 of the present invention. This embodiment is optimized on the basis of the above embodiments, such as figure 2 As shown, the abnormal construction method of the storage device provided in the embodiment of the present invention may include:

[0051] S210. Obtain an abnormal parameter of the storage device in response to the program under test calling the target rewriting operation function in the preloaded library.

[0052] In the embodiment of the present invention, in addition to at least one type of abnormal operation information of the storage device related to the operation function of the storage device, the exception parameter also includes abnormal configuration conditions. In a specific business scenario, many programs are required for processing, so the target program that needs exception construction among multiple programs can be judged through...

Embodiment 3

[0066] image 3 It is a schematic structural diagram of an abnormal configuration device for a storage device provided in Embodiment 3 of the present invention. Such as image 3 As shown, the device includes:

[0067] Abnormal parameter acquisition module 310, used to respond to the call of the program under test to the target rewriting operation function in the preloaded library, and obtain the abnormal parameter of the storage device;

[0068] An abnormal operation information acquisition module 320, configured to acquire abnormal operation information of the storage device corresponding to the target rewriting operation function from the abnormal parameters;

[0069] The first feedback module 330 is configured to feed back the abnormal operation information of the storage device to the program under test;

[0070] Wherein, the program under test is started based on a preloaded library, and the preloaded library includes a plurality of rewriting operation functions, and e...

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Abstract

The embodiment of the invention discloses an abnormal construction method and device for storage equipment, electronic equipment and a storage medium, and the method comprises the steps: responding tothe call of a tested program for a target rewriting operation function in a preloading library, and obtaining an exception parameter of the storage equipment; obtaining storage device abnormal operation information corresponding to a target rewriting operation function from the abnormal parameters; feeding back abnormal operation information of the storage device to the tested program; wherein the tested program is started based on a preloading library, the preloading library comprises a plurality of rewriting operation functions, and each rewriting operation function is obtained by rewritingbased on a storage device operation function of an application layer. The abnormal structure takes effect quickly, manual participation is not needed, limitation of equipment types is avoided, and the abnormal structure is accurate.

Description

technical field [0001] Embodiments of the present invention relate to the field of computer technology, and in particular, to an abnormal construction method, device, electronic device, and storage medium of a storage device. Background technique [0002] With the rapid development of cloud computing, big data, mobile Internet and social media, the amount of data generated by various industries is increasing exponentially, and systems such as distributed storage systems for data storage and management have high performance And high reliability and other characteristics, has been widely used in many industries. [0003] These distributed storage systems are usually built on storage devices, such as disks, and disk failure is one of the most common hardware failures, and its fault-tolerant processing has become one of the core design points of distributed storage systems. Therefore, storage Automated testing of equipment exception scenarios is an important part of the quality...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/07G06F11/36G06F9/50
CPCG06F11/0727G06F11/073G06F11/3688G06F9/5016
Inventor 何赛松杜雪丽王纯徐鹏
Owner BAIDU ONLINE NETWORK TECH (BEIJIBG) CO LTD
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