Method for calibrating silicon nanowire sensor by using cursor
A silicon nanowire and sensor technology, applied in the field of sensors, can solve problems such as inability to perform accurate quantitative testing, silicon nanowire size deviation, affecting device consistency, etc., and achieve the effects of stable test results, low cost, and convenient testing.
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[0046] In order to make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be described clearly and completely in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of the embodiments of the present invention, not all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work shall fall within the protection scope of the present invention. In order to solve the problems in the prior art, the present invention provides a method for positioning a silicon nanowire sensor using a cursor, such as figure 1 As shown, the method includes:
[0047] S100. Perform surface modification on the silicon nanowire sensor;
[0048] Specifically, the present invention intends to use the light response...
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