Unlock instant, AI-driven research and patent intelligence for your innovation.

A module defect detection method and system

A defect detection and module technology, applied in optical testing defects/defects, measuring devices, instruments, etc., can solve problems such as time cost and labor cost increase, panel missed inspection, increase material cost, etc. Improve performance, the effect of simple method

Active Publication Date: 2020-11-24
WUHAN JINGLI ELECTRONICS TECH +1
View PDF11 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] As for how to distinguish the foreign matter in the cover plate from the foreign matter on the cover plate, the existing technical solutions either directly ignore this problem, but this will lead to a large number of missed detections of such defects during panel inspection; or set up a separate re-judgment station Re-judgment by personnel one by one will increase the cost of time and labor; either add a line-scan camera to distinguish foreign objects on the top and bottom of the cover through the advantage of the line-scan camera, but this not only requires adding a line-scanning machine position on the machine It will also increase the material cost

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A module defect detection method and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0031] In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other. The present invention will be further described in detail below in combination with specific embodiments.

[0032] A module defect detection method, which is used for module detection equipment to detect the module to be inspected, and can accurately identify whether the defect belongs to a foreign matter defect in the cover glass or dust on the cover glass, referred to in this applicatio...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a defect detection method and system for a module. A to-be-detected module is lightened to display a preset gray-scale picture, a side light source of module detection equipment is turned on to obtain a first detection picture, the detection of foreign matter defects in the cover plate glass is realized through the darkening defects in the first detection picture, and underthe combined action of backlight and sidelight, the foreign matters under the cover plate and the foreign matters on the cover plate are accurately classified through the combination of the L128 andthe Part picture, so that the subsequent defect judgment and output are facilitated.

Description

technical field [0001] The invention belongs to the field of module detection, and in particular relates to a module defect detection method and system. Background technique [0002] As more and more brands launch new products such as touch mobile phones, touch tablets and touch vehicle display screens, the demand for testing of such products is also increasing. When adding Cover Glass (cover glass) to the display panel, dust may enter; when bonding the display panel and the cover, there will be adhesive overflow into the display area. These process problems will reduce the quality of the product. Manufacturers These are required to be detected as defects. [0003] Usually AOI inspection is carried out, the dust on the panel surface will be darkened in the white, R / G / B, L48, L0 screens, and then the dust on the upper surface will be brightened through the Particle screen (that is, the screen with side light only) to filter the dust and reduce the overshoot However, the dus...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/94G01N21/958
CPCG01N21/94G01N21/958
Inventor 程果余鑫
Owner WUHAN JINGLI ELECTRONICS TECH
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More