Pantograph foreign matter detection method, storage medium and computer equipment

A foreign object detection and pantograph technology, applied in the field of pantograph-catenary detection, can solve the problems of high false alarm rate, large amount of image data processing, and low foreign object recognition rate

Active Publication Date: 2020-10-02
SOUTHWEST JIAOTONG UNIV +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In order to overcome the defects and deficiencies in the above-mentioned prior art, the application provides a pantograph foreign object detection method. Handle high-volume problems

Method used

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  • Pantograph foreign matter detection method, storage medium and computer equipment
  • Pantograph foreign matter detection method, storage medium and computer equipment
  • Pantograph foreign matter detection method, storage medium and computer equipment

Examples

Experimental program
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Embodiment 2

[0103] As another preferred embodiment of the present invention, with reference to the attached figure 1 , this example discloses:

[0104] A pantograph foreign object detection method, comprising the following steps:

[0105] Image processing steps: collect and read in the grayscale image I of the pantograph slider area, use the local adaptive binarization method to binarize the image of the pantograph slider area, and obtain the binarized image E; perform morphological processing on the image E obtained after binarization processing to obtain an image M; perform denoising processing on the image M after morphological processing to obtain an image Image after denoising Search the connected domain in , and output the outer boundary of the connected domain as a contour, and a certain contour of the output is c k ; Calculate the contour parameters of the output contour, the contour parameters include the contour area A ck , Contour area to contour box area ratio AR ck , pr...

Embodiment 3

[0111] As another preferred embodiment of the present invention, with reference to the attached figure 1 , this example discloses:

[0112] A pantograph foreign object detection method, comprising the following steps:

[0113] Image processing steps: collect and read in the grayscale image of the pantograph slider area, use the local adaptive binarization method to binarize the image of the pantograph slider area, and perform binarization on the image obtained after binarization Morphological processing, denoising the morphologically processed image, searching the connected domain in the denoised image, and outputting the outer boundary of the connected domain as a contour; calculating the contour parameters of the output contour, The contour parameters include contour area, contour area to contour frame area ratio, contour width, contour height and contour aspect ratio;

[0114] Threshold I judging step, comparing and judging the contour parameters calculated in the image p...

Embodiment 4

[0149] In order to achieve the above object, according to another aspect of the present application, a computer device is also provided, including a memory, a processor, and a computer program stored in the memory and operable on the processor, and the processor executes the computer program. The program realizes the steps of the above pantograph foreign object detection method.

[0150] In this embodiment, the processor may be a central processing unit (Central Processing Unit, CPU). The processor can also be other general-purpose processors, digital signal processors (Digital Signal Processor, DSP), application-specific integrated circuits (Application Specific Integrated Circuit, ASIC), field-programmable gate array (Field-Programmable Gate Array, FPGA) or other Chips such as programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or combinations of the above-mentioned types of chips.

[0151] As a non-transitory computer-readab...

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Abstract

The invention discloses a pantograph foreign matter detection method, a storage medium and computer equipment, and relates to the technical field of pantograph-catenary detection. According to the invention, the method includes: carrying out binarization processing on an input image; carrying out morphological processing on the image after binarization processing; carrying out denoising processingon the image after morphological processing; and extracting a contour from the denoised image, calculating contour parameters, performing multi-dimensional threshold screening on the contour parameters, performing gray parameter threshold screening on an original gray image of the contour, thereby eliminating a part of non-foreign-matter images, performing SVM classification processing, and finally identifying a pantograph foreign-matter image. The pantograph foreign matter detection method provided by the invention can adapt to the diversity of foreign matters and the complexity of an imagebackground, the foreign matter candidate boxes are determined through an image processing method before an SVM model is trained, then part of the candidate boxes are filtered out through morphologicalscreening and gray feature screening, the low omission ratio is guaranteed, and the SVM classification efficiency and precision are improved.

Description

technical field [0001] The present invention relates to the technical field of pantograph-catenary detection, in particular to the technical field of pantograph detection, and more specifically to a pantograph foreign object detection method, storage medium and computer equipment. Background technique [0002] All rail transit trains obtain electric energy from the outside through the sliding contact between the train pantograph and the catenary, and the contact relationship between the pantograph and catenary is crucial to the safe and normal operation of the train. Due to the special contact relationship between the pantograph and the catenary and the structural characteristics, it is not convenient to install test equipment on the pantograph or catenary of the operating train. Moreover, once the operating train has serious abnormal contact with the pantograph or catenary or attaches foreign objects, the It is also not convenient to board the roof for inspection, and it is...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62G06K9/38G06K9/00G06T7/13G06T7/136G06T5/00G06T5/30
CPCG06T7/13G06T7/136G06T5/002G06T5/30G06T2207/20032G06T2207/20081G06V20/52G06V10/28G06F18/213G06F18/2411
Inventor 占栋高仕斌于龙向文剑刘朝洪邓伪兵
Owner SOUTHWEST JIAOTONG UNIV
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