Variable-temperature measuring device for high-flux thermoelectric material

Abstract

The invention discloses a variable-temperature measuring device for a high-flux thermoelectric material, which relates to the technical field of thermoelectric material testing, and comprises an uppercomputer, a PLC (Programmable Logic Controller), a signal generation and data acquisition system, a vacuum system, a heating system, a moving platform, a probe, a sample holder and a clamp, the sample holder is fixed on a workbench, and the sample holder is arranged in an annular heating body; the clamp is fixed on the sample holder, the motion platform is fixed on the workbench, and the probe isdetachably mounted on the motion platform; the vacuum pump, the temperature detector, the temperature control device, the motion platform, the signal generation and data acquisition system and the force sensor are all connected with the PLC, the signal generation and data acquisition system is connected with the upper computer, the signal generation and data acquisition system is used for measuring the thermal conductivity, the electrical conductivity and the seebeck coefficient of a sample, and the upper computer is connected with the PLC. The device can carry out variable temperature measurement on a plurality of different test positions of a sample, and achieves rapid characterization of the high-flux thermoelectric material.

Description

technical field [0001] The invention relates to the technical field of thermoelectric material testing, in particular to a temperature-variable measuring device for high-throughput thermoelectric materials. Background technique [0002] The energy conversion of thermoelectric materials mainly depends on the thermoelectric effect, mainly including Seebeck effect, Boltier effect and Thomson effect. Among them, the Seebeck effect is an important research direction. This effect can convert thermal energy into electrical energy in a direct way. It is specifically manifested as a potential difference between the two ends of an object with a temperature difference. Generally, thermoelectric materials with higher performance should have larger electrical conductivity and Seebeck coefficient, and also have smaller thermal conductivity. Its performance can be characterized by the dimensionless ZT value ZT=S 2 σT / κ, where S represents the Seebeck coefficient of the material, σ repres...

AI Technical Summary

Problems solved by technology

At present, for the high-throughput characterization of thermoelectric materials, the electrical performance screening mainly relies on the commercial conductivity-Seebeck coefficient scanning probe, and the thermal conductivity is semi-quantitatively characterized by the thermal performance infrared screening system, but in the actual performance screening , the above scheme and technology have the following three shortcomings: First, the thermal conductivity cannot give quantitative results

Secondly, whether it is a commercial conductivity-Seebeck coefficient scanning probe or a thermal scanning probe, it can only be used for room temperature performance measurement at present, but most thermoelectric materials need to measure variable temperature thermoelectric properties

Finally, this screening scheme cannot quantitatively give the most direct index ZT value that determines the thermoelectric performance

[0004] In summary, the current methods for high-throughput performance characterization of thermoelectric materials are seriously deficient.

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