Superconducting optical detector based on silicon-based etching and optical fiber alignment method and device

A technology for aligning optical detectors and optical fibers, applied in the field of optical detection, can solve the problems of low photon detection efficiency of superconducting photon detectors and complicated alignment process operations

Active Publication Date: 2020-11-17
NAT INST OF METROLOGY CHINA
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

As a result, the operation of the alignment process is complicated and needs to be repeated many times

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Superconducting optical detector based on silicon-based etching and optical fiber alignment method and device
  • Superconducting optical detector based on silicon-based etching and optical fiber alignment method and device
  • Superconducting optical detector based on silicon-based etching and optical fiber alignment method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0041] In order to facilitate the understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Embodiments of the application are given in the drawings. However, the present application can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of this application more thorough and comprehensive.

[0042] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field to which this application belongs. The terms used herein in the specification of the application are only for the purpose of describing specific embodiments, and are not intended to limit the application.

[0043] It will be understood that when an element or layer is referred to as being "on," "adjacent," "con...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a superconducting optical detector based on silicon-based etching and optical fiber alignment method and device. The first substrate is etched, an optical fiber position through hole is formed, and a plurality of first marks arranged at intervals are prepared on the surface of the first substrate; a relative position relationship is formed between the plurality of first marks and the optical fiber position through hole. When the single-photon absorption film is prepared on the surface of the second substrate, the second substrate is used as a substrate of the superconducting single-photon detector, and the superconducting single-photon detector is prepared by adopting a preparation process of the superconducting single-photon detector. At this time, a relative position relationship is formed between the plurality of second marks and the single-photon absorption film, and is the same as a relative position relationship between the plurality of first marks and the optical fiber position through hole. Furthermore, the plurality of first marks and the plurality of second marks are in one-to-one correspondence, so that the alignment of the optical fiber positionthrough hole and the single-photon absorption film can be achieved. Therefore, the optical fiber is directly placed in the optical fiber position through hole, and alignment with the single-photon absorption film can be achieved.

Description

technical field [0001] The present application relates to the field of optical detection technology, in particular to a method and device for aligning a superconducting optical detector and an optical fiber based on silicon-based etching. Background technique [0002] Compared with traditional semiconductor photon detectors, superconducting photon detectors have high quantum efficiency, excellent photon number resolution and energy resolution, and their dark count rate is almost negligible. Superconducting photon detectors are widely used in astronomical detection, quantum communication, bioluminescence sensing and other fields. Due to its high quantum efficiency, it is an ideal photon detector for single-photon metrology. [0003] Among them, the key parameter of the superconducting single photon detector is the quantum efficiency. The factor that has the greatest influence on the quantum efficiency is the coupling efficiency between the optical fiber and the photon absorp...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G02B6/42
CPCG02B6/4228
Inventor 王雪深钟青李劲劲徐骁龙陈建钟源曹文会王仕建
Owner NAT INST OF METROLOGY CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap