Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Multi-physical parameter sensing device and method based on optical tweezers and spin defects

A spin defect and multi-physics technology, applied in the fields of navigation, mapping and sensing, can solve the problems of multiple sensors, high energy consumption, and large volume, and achieve the effects of avoiding gradient differences, saving costs, and saving load space

Active Publication Date: 2021-01-22
ZHEJIANG LAB +1
View PDF9 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Using this solution requires many sensors, the corresponding volume is large, and the energy consumption is high; secondly, the physical parameters measured by multi-sensors come from different spatial locations, and it is difficult to analyze multiple physical quantities in the same spatial location.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-physical parameter sensing device and method based on optical tweezers and spin defects
  • Multi-physical parameter sensing device and method based on optical tweezers and spin defects
  • Multi-physical parameter sensing device and method based on optical tweezers and spin defects

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0034] The present invention will be described in detail below with reference to the accompanying drawings and preferred embodiments, and the purpose and effect of the present invention will become clearer. It should be understood that the specific embodiments described here are only used to explain the present invention and are not intended to limit the present invention.

[0035] Such as figure 1 As shown, the multi-physical parameter sensing device based on optical tweezers and spin defects of the present invention includes a first laser 1, a second laser 2, a first optical modulator 3, a second optical modulator 4, and a beam splitter 5. Beam combiner 6, objective lens 7, lens 9, first photodetector 10, second photodetector 11, microwave source 12, microwave modulator 13, microwave antenna 14, dichromatic film 15, fluorescence detector 16, control display system 17;

[0036] Wherein, the first laser 1 emits and captures laser light, enters the beam splitter 5 after passin...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a multi-physical parameter sensing device and method based on optical tweezers and spin defects. The device comprises a first laser, a second laser, a first light modulator, asecond light modulator, a beam splitter, a beam combiner, an objective lens, a lens, a first photoelectric detector, a second photoelectric detector, a microwave source, a microwave modulator, a microwave antenna, a double-color sheet, a fluorescence detector and a control display system. Micro-nano diamond particles with spin defects are suspended in an optical trap, and various physical parameters are obtained according to the movement of diamond particles. According to the device and the method, multi-physical parameter sensing at the same spatial position can be realized, and the gradientdifference of information is avoided; according to the device, systems required by different detection objects are integrated together, multi-physical-parameter detection of a single device is achieved, the load space is saved, and the cost is saved.

Description

technical field [0001] The invention relates to the field of sensing and navigation surveying and mapping, in particular to a device and method for sensing multiple physical parameters based on optical tweezers and spin defects. Background technique [0002] In aviation, aerospace, navigation, submarine exploration and other related fields, in order to take into account the requirements of safe navigation and scientific detection, spacecraft, aircraft or submarines need to carry a variety of sensing devices, including gyroscopes, gravimeters, magnetometers and temperature detectors. is the standing load. Among them, the gravity sensing equipment and angular velocity sensor gyroscope used for attitude control and navigation are necessary for navigation; the measurement of temperature and magnetic field is an important parameter in the field of aerial survey, which is very important for ensuring the normal flight of spacecraft and studying the space environment. value. [00...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R33/032G01K11/20
CPCG01R33/032G01K11/20
Inventor 李翠红刘承陈志明蒋静李楠胡慧珠
Owner ZHEJIANG LAB
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com