Hybrid integrated circuit detection system and method
A hybrid integrated circuit and detection system technology, applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve the problems of irregularity, large size, poor contact, etc., to achieve high test efficiency, strong flexibility, and avoid damage. Effect
Pending Publication Date: 2021-01-29
BEIJING ZHENXING METROLOGY & TEST INST
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Problems solved by technology
Conventional testing fixtures use universal locking seats, which can easily cause problems such as poor contact and pin damage
[0003] Patents CN102435876A, CN202113034U, and CN204989229U provide fixtures or test sockets that use metal spring probes to test chips. This type of chip test fixture is suitable for monolithic integrated circuits, and one fixture can only be used for a single chip test, which has poor versatility; and For hybrid integrated circuits with large volume, thick metal pins, irregular arrangement, and large power dissipation, this type of chip test fixture cannot be applied
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[0021] The invention provides a hybrid integrated circuit detection system, which is based on system integration detection equipment and used for detection of hybrid integrated circuits.
[0022] The invention includes a resource box and a detection fixture. The main function of the resource box is to introduce the instrumentation signal port of the testing equipment and integrate the control circuit. The resource box is connected with the testing fixture, and the equipment instrumentation signal is introduced into the testing device to realize the electrical performance testing of the device under test. Place the device on the inspection fixture, and use metal pins to contact the device pins to effectively protect the device pins and reduce the possibility of deformation and damage to the device pins. The detection tooling can realize the detection of various hybrid integrated circuits, and has high reliability, strong flexibility and high test efficiency.
[0023] The reso...
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The invention provides a hybrid integrated circuit detection system and method, and the system comprises a resource box and a detection clamp, the detection clamp comprises a PCB, a bearing plate, a signal input interface, a detection probe structure, and a pushing structure, the resource box and the detection clamp carry out the electric signal transmission through the signal input interface, andthe PCB and the bearing plate are fixed in parallel. A certain gap exists between the PCB and the bearing plate, and the detection probe structure and the pushing structure are installed on the bearing plate. The special detection clamp is adopted, a metal spring probe is in flexible contact with a device pin, and the damage to the pin is avoided while the effective contact with the device pin isguaranteed.
Description
technical field [0001] The invention relates to a hybrid integrated circuit detection system and method, and belongs to the technical field of component reliability testing. Background technique [0002] At present, most hybrid integrated circuit testing equipment is integrated with various instruments and instrumentation systems such as power supplies, electronic loads, and oscilloscopes. The pin arrangement, number and thickness of hybrid integrated circuit devices are inconsistent, and the detection device lacks standardization and generalization. Conventional testing fixtures use universal locking seats, which can easily cause problems such as poor contact and pin damage. [0003] Patents CN102435876A, CN202113034U, and CN204989229U provide fixtures or test sockets that use metal spring probes to test chips. This type of chip test fixture is suitable for monolithic integrated circuits, and one fixture can only be used for a single chip test, which has poor versatility; ...
Claims
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Login to View More IPC IPC(8): G01R31/28
CPCG01R31/2887
Inventor 温恒娟李骥尧陈覃
Owner BEIJING ZHENXING METROLOGY & TEST INST