Appearance defect intelligent detection method and system based on machine vision

A technology for appearance defects and intelligent detection, which is applied in the direction of optical testing flaws/defects, instruments, measuring devices, etc. It can solve the problems of high rate of missed detection and false detection, detection standards are affected by personal subjective factors, and high labor costs, so as to improve detection Efficiency, reduction of missed detection and false detection rate and labor cost, and improvement of production cycle

Inactive Publication Date: 2021-02-02
天津朗硕机器人科技有限公司
View PDF10 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Appearance defect intelligent detection technology is a detection technology that is urgently needed in modern times. In the traditional detection method, the detection of product appearance defects mainly relies on the human eye detection of workers, but due to the subjectivity and visual fatigue of the workers themselves, this detection method There are shortcomings such as the detection standard is affected by personal subjective factors, the rate of missed detection and false detection is high, and the labor cost is high.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Appearance defect intelligent detection method and system based on machine vision
  • Appearance defect intelligent detection method and system based on machine vision
  • Appearance defect intelligent detection method and system based on machine vision

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0052] as attached figure 1 , 2 As shown, an intelligent detection method and system for appearance defects based on machine vision, the intelligent detection system for appearance defects includes a path planning unit, a parameter setting unit, a surface path defect detection unit, an edge path defect detection unit, and an appearance defect detection result mark unit, which includes the following steps:

[0053] Step 1: Path planning unit: carry out path planning according to the appearance size of the product to be inspected and the slicing method, and obtain two paths of the surface and the edge of the product through the transformation of the three-dimensional coordinate system;

[0054] Step 2: Parameter setting unit: Set corresponding parameters according to the color of the product to be inspected and two paths, including image preprocessing parameters, light source parameters, and defect parameters;

[0055] Step 3: Surface path defect detection unit: Obtain the app...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides an appearance defect intelligent detection method and system based on machine vision. The method specifically comprises the following steps: carrying out the path planning according to the appearance size of a to-be-detected product and a slicing method, and obtaining the surface and edge paths of the product through the conversion of a three-dimensional coordinate system; setting corresponding parameters according to the color of the to-be-detected product and the two paths; obtaining and preprocessing appearance images on the current surface path point and the edge path point, carrying out automatic threshold segmentation to obtain an appropriate binary image, using a feature extraction algorithm and a contour size and contour matching image processing method to screen corresponding defects, and obtaining defect detection results on the surface path point and the edge path point; after the appearance detection process is finished, counting defect detection results of all surface path points and edge path points, marking the positions corresponding to the model and displaying the positions. The detection efficiency of the product appearance detection processis effectively improved via the appearance defect intelligent detection method, the missing detection and false detection rate and the labor cost are reduced, and the production takt is improved.

Description

technical field [0001] The invention belongs to the field of appearance defect detection, and in particular relates to an intelligent detection method and system for appearance defects based on machine vision. Background technique [0002] Machine vision is a comprehensive technology, including image processing, mechanical engineering technology, control, electric light source lighting, optical imaging, sensors, analog and digital video technology, computer software and hardware technology (image enhancement and analysis algorithms, image cards, I / O card, etc.). A typical machine vision application system includes image capture, light source system, image digitization module, digital image processing module, intelligent judgment decision module and mechanical control execution module. [0003] The feature of machine vision system is to improve the flexibility and automation of production. In some dangerous working environments that are not suitable for manual work or where...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88G06T7/00G06T7/136G06T7/194G06T7/13
CPCG01N21/88G01N21/8851G06T7/0004G06T7/136G06T7/194G06T7/13G01N2021/887G01N2021/888G01N2021/8887G06T2207/20024G06T2207/30108
Inventor 戈朝波靳津马金荣张保伟张青于少冲曹凯
Owner 天津朗硕机器人科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products