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Single event effect testing device based on laser accelerator

A single event effect and testing device technology, applied in electronic circuit testing, non-contact circuit testing, plasma, etc., can solve the problems of incomplete simulation of the cosmic radiation environment, high energy and flux, and large device volume, and achieve The effect of convenient and flexible adjustment, small size and low cost

Pending Publication Date: 2021-02-19
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

Traditional accelerators can accelerate many types of ions, with relatively high energy and flux, short research period, and controllable experimental conditions; but they cannot fully simulate the cosmic radiation environment, and the entire device is large in size

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  • Single event effect testing device based on laser accelerator

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Embodiment Construction

[0019] In order to make the above-mentioned advantages of the present invention clearly understandable, the specific implementation manners of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be noted that the present invention should not be limited to the following specific implementation content, and those skilled in the art should understand the present invention from the spirit embodied in the following embodiments, and each technical term can be based on the spirit of the present invention. Do the broadest understanding.

[0020] see first figure 1 , figure 1 It is a schematic structural diagram of a single event effect test device based on a laser accelerator. It can be seen from the figure that a single event effect test device based on a laser accelerator includes a femtosecond laser device 1, a laser transmission system 2, a laser focusing system 3, an ion acceleration system 4, and an ion Beam shaping ...

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Abstract

A single event effect testing device based on a laser accelerator comprises a femtosecond laser device, a laser transmission system, a laser focusing system, an ion acceleration system, an ion beam shaping focusing system, a single event effect testing system and a vacuum target chamber system. Laser pulses generated by the femtosecond laser device are focused on an acceleration target of the ionacceleration system to generate a high-energy ion beam after passing through the laser transmission and focusing system, the ion beam shaping and focusing system is used for shaping and focusing the ion beam, the ion beam is transmitted to the single event effect testing system, and single event effect testing is achieved. Laser-driven accelerated ions are applied to the field of single event effect testing, and the device has the advantages of being table-type, flexible in direction adjustment, rich in particle variety, wide in energy spectrum, controllable in energy and the like, and can beapplied to space radiation environment simulation and the like.

Description

technical field [0001] The invention relates to the fields of laser plasma action and single-event effect, in particular to a single-event effect testing device based on a laser accelerator. Background technique [0002] Galactic cosmic rays, solar cosmic rays, and high-energy particles in the Earth's radiation belt are incident on electronic devices, and interact with the device to generate electron-hole pairs or atomic displacement damage, causing radiation effects on the device. The single event effect is a common radiation effect. At present, the experimental research of single event effect mainly adopts two ways: space loading and ground simulation. The space carrying method is to put the equipment dedicated to the study of single event effects on the spacecraft to test the radiation resistance characteristics of the device; the data is real and effective, but the experiment cost is high and the cycle is long. Ground simulation of single event effects mainly adopts tr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H05H1/54G01R31/303
CPCH05H1/54G01R31/303
Inventor 沈百飞李顺张辉李昂骁秦承宇吉亮亮
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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