Tokamak plasma internal fast electron high temporal-spatial resolution imaging system

Abstract

The invention discloses a Tokamak plasma internal fast electron high temporal-spatial resolution imaging system. The system comprises a small hole imaging probe, a vacuum sealing pipeline, an image transmission system and an image enhancement and acquisition system. The tokamak plasma fast electron imaging measuring system is advantaged in that problems existing in an existing tokamak plasma fastelectron imaging measuring system are effectively solved, the space-time resolution of a measuring result is improved, meanwhile, measuring precision and reliability can be improved, and the tokamak plasma fast electron imaging measuring system is very suitable for high space-time evolution image measurement of tokamak plasma fast electrons.

Description

technical field [0001] The invention belongs to a nuclear measurement system, in particular to a high-time-space resolution imaging measurement system for fast electrons in a tokamak plasma, and is particularly suitable for the fast electron imaging measurement system of a magnetic confinement nuclear fusion device. Background technique [0002] Under the conditions of circular electric field acceleration, radio frequency wave heating and current driving, a large number of fast electrons will be generated in the magnetic confinement nuclear fusion plasma, and these fast electrons can excite the instability of the magnetic fluid, resulting in the degradation of the plasma confinement quality. In addition, these fast electrons enter the escape region under the acceleration of the circular electric field and become escape electrons. The generation of a large number of escape electrons will lead to the formation of escape electron beams. When the escape electron beams lose the pl...

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Problems solved by technology

The current fast electron imaging measurement system has the following problems: (1) The spatial resolution is low, because the hard X-ray detector array is composed of a single detector, and the detector has a certain volume, which limits the space of the measurement system Resolution; (2) time resolution is low, hard X-ray detectors usually adopt semiconductor detectors, and its count rate is in the order of 105cps, because it is limited by the detector count rate, the time resolution of fast electron imaging is relatively low; ( 3) The measurement accuracy is low. Some conditions are assumed during the tomographic inversion calculation, and the fast electron image obtained is not completely consistent with the actual situation, so the accuracy of the measurement results is low

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