Inorganic nonmetallic material performance analysis method based on three-dimensional random reconstruction

Abstract

The invention discloses an inorganic nonmetallic material performance analysis method based on three-dimensional random reconstruction. According to the method, on the basis of an electron microscope which is a common means for analyzing inorganic nonmetallic materials, two-dimensional images of all sections are obtained through continuous multi-time scanning at different depths, then the two-dimensional images are processed into crystal component characteristic matrixes, the multiple two-dimensional crystal component characteristic matrixes are reconstructed, and a three-dimensional crystal characteristic matrix is generated; meanwhile, crystal component characteristics are extracted, a characteristic library is formed, and preparation is made for further three-dimensional random reconstruction; The three-dimensional crystal feature matrix is randomly reconstructed based on the characteristic library to form a new matrix, the new matrix is converted into an input file of finite element software, and finally computational analysis is made to obtain performance parameters of the inorganic non-metallic material.

Description

technical field [0001] The invention relates to the field of material technology, in particular to a performance analysis method for inorganic non-metallic materials based on three-dimensional random reconstruction. Background technique [0002] Inorganic non-metallic materials are materials composed of oxides, carbides, nitrides, halogen compounds, borides, silicates, aluminates, phosphates, borates and other substances of certain elements. The performance of most inorganic non-metallic materials is determined by the microstructure and morphological distribution of the constituent elements. The most commonly used method is to obtain the microstructure image of the material surface through an electron microscope, and then analyze its structural characteristics through the information in the image. Infer material properties. This scheme has great limitations, and can only obtain information on one plane. In fact, the crystals of different components in inorganic non-metalli...

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Problems solved by technology

This process requires a lot of manpower and material costs, and the time period is very long. There are also large errors in the two-dimensional images obtained by analyzing the electron microscope, and finally there is a risk of test failure.

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