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Atmospheric particulate collection method and system for electron microscope, medium, device and application

A technology of atmospheric particulate matter and collection method, which is applied in the direction of measuring device, particle suspension analysis, particle and sedimentation analysis, etc., can solve the problems of long sampling time period, low efficiency, low efficiency, etc., achieve fast and convenient time, and shorten the sampling period , The effect of improving collection efficiency

Pending Publication Date: 2021-04-13
SHANDONG NORMAL UNIV
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Problems solved by technology

[0003] Through the above analysis, the existing problems and defects of the existing technology are: the current conventional particle monitoring (PM2.5, PM10) can only detect the number of particles contained in a unit volume, even if it is a particle sample observed by a scanning electron microscope or a transmission electron microscope. The particulate matter sample collected by the 24-hour natural sedimentation method has a long sampling time period and low efficiency, which makes the real-time detection result take a long time, and the monitoring result cannot be obtained quickly with high efficiency. Insufficient particle morphology and distribution

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  • Atmospheric particulate collection method and system for electron microscope, medium, device and application
  • Atmospheric particulate collection method and system for electron microscope, medium, device and application

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Embodiment Construction

[0047] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.

[0048] In view of the problems existing in the prior art, the present invention provides a method, system, medium, device and application for collecting atmospheric particulate matter for electron microscopy. The present invention is described in detail below with reference to the accompanying drawings.

[0049] like figure 1 As shown, the method for collecting atmospheric particulate matter for electron microscopy provided by the present invention includes the following steps:

[0050] S101: Quickly collect various types of particulate matter distributed in the atmosphere using the collection device used by the e...

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Abstract

The invention belongs to the technical field of electron microscope sample collection and detection, and discloses an atmospheric particulate collection system and method for an electron microscope. The system comprises a laser emission module, a photoelectric detection module, a data processing module, and a central control module; a laser particulate matter sensor is provided with a shell; an MCU microprocessor is arranged in the shell; the output end of the MCU microprocessor is connected with a laser through a laser control circuit; the input end of the MCU microprocessor is connected with a photoelectric detector through an amplifying circuit; and the output end of the MCU microprocessor is connected with a data output interface and connected with a fan through a control circuit. The laser emits laser, and the laser irradiates suspended particles in the air to generate light scattering; the photoelectric detector collects scattered light intensity within a certain angle range, linearly converts the obtained scattered light intensity into voltage and transmits the voltage to a data processing system module; and the data processing module performs data processing through a data processing program to obtain the equivalent particle size of the particles and the number of the particles with different particle sizes in unit volume.

Description

technical field [0001] The invention belongs to the technical field of electron microscope sample collection and detection, and in particular relates to a method, system, medium, device and application for collecting atmospheric particulate matter for electron microscope. Background technique [0002] In recent years, air pollution has been aggravated by the emission of industrial polluting gases, the tail gas emissions caused by the large growth of private cars, and the large-scale burning of coal in the process of urban heating. Therefore, the monitoring of "atmospheric particulate matter" has attracted people's attention and research interest. Atmospheric particulate matter refers to the general term for various solid and liquid particulate matter existing in the atmosphere, and is also an important indicator for measuring air quality. The composition of atmospheric particulate matter is complex and mainly depends on the source. The existing technology uses the chemical...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N15/00G01N15/02G01N15/06
CPCG01N15/00G01N15/0211G01N15/02G01N15/06G01N15/075
Inventor 张晓凯孙敏孙艺源乔聪
Owner SHANDONG NORMAL UNIV
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