Atmospheric particulate collection method and system for electron microscope, medium, device and application
A technology of atmospheric particulate matter and collection method, which is applied in the direction of measuring device, particle suspension analysis, particle and sedimentation analysis, etc., can solve the problems of long sampling time period, low efficiency, low efficiency, etc., achieve fast and convenient time, and shorten the sampling period , The effect of improving collection efficiency
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[0047] In order to make the objectives, technical solutions and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.
[0048] In view of the problems existing in the prior art, the present invention provides a method, system, medium, device and application for collecting atmospheric particulate matter for electron microscopy. The present invention is described in detail below with reference to the accompanying drawings.
[0049] like figure 1 As shown, the method for collecting atmospheric particulate matter for electron microscopy provided by the present invention includes the following steps:
[0050] S101: Quickly collect various types of particulate matter distributed in the atmosphere using the collection device used by the e...
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