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Dynamic ion filter for reducing high-abundance ions

A technology of ions and ion beams, applied in dynamic spectrometers, particle separation tubes, excess particle removal/transfer, etc., can solve the problem of prolonging the complete process time

Pending Publication Date: 2021-04-20
耶拿分析仪器股份公司
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  • Summary
  • Abstract
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Problems solved by technology

However, the disadvantage is that a compromise must always be found between the duration of the full cycle and the achievable sensitivity, since the full process time increases significantly with the number of subranges

Method used

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  • Dynamic ion filter for reducing high-abundance ions
  • Dynamic ion filter for reducing high-abundance ions
  • Dynamic ion filter for reducing high-abundance ions

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Embodiment Construction

[0054] figure 1 A schematic illustration of a device 1 according to the invention is shown for filtering out selected ions (here based on a selected mass: m 1 and m 3 ). The ion beam can be generated using any ionization method known in the art. Unit 2 is based on the time-of-flight (TOF) measurement principle. The ions of the ion beam 2 follow their flight path F on a flight path d of predetermined length, with respect to their mass m 1 to m 3 or mass-to-charge ratio. Therefore, different ions m 1 to m 3 The ion optics 4 , which is arranged at the end of the flight path d, is impinged at different points in time. To travel along flight path d, ion m 1 to m 3 This requires a different flight time t 1 to t 3 .

[0055] The ion optical system 4 is used to make the selected ion m 1 and m 3 Deflection from the flight path F of the ion beam 2 . To this end, the device 1 is designed such that according to the selected ion m 1 and m 3 The flight time t along the fli...

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Abstract

The present invention relates to a device (1) for filtering at least one selected ion (m1, m3) out of an ion beam (2) comprising - a unit (3) for creating an electric field for accelerating the ions of the ion beam (2) along a flight path of predefinable length (d), and a controllable ion optical system (4), which delimits the flight path (d) in one direction, and which is used to deflect the selected ion (m1, m3) from a flight path (F) of the ion beam (2). The device (1) is further designed to control the ion optical system (4) subject to a flight time (t1, t3) of the selected ion (m1, m3) along the flight path (d). The present invention also relates to a mass spectrometer (10) having a device (1) according to the invention, and to a method for filtering at least one selected ion (m1, m3) out of an ion beam (2).

Description

technical field [0001] The invention relates to a device for filtering out ions with at least one selected ion mass from an ion beam, to a mass spectrometer with a device according to the invention, and to a device for filtering out an ion beam with A method for at least one ion of a selected ion mass. Background technique [0002] Analysis and / or characterization of samples by mass spectrometry is widely used today in various fields such as chemistry, especially medicinal chemistry. Many different types of mass spectrometers are known from the prior art, such as sector mass spectrometers, quadrupole mass spectrometers or time-of-flight mass spectrometers, or also mass spectrometers with inductively coupled plasmas. The modes of operation of different mass spectrometers have been described in many publications and therefore will not be explained in detail here. [0003] In a mass spectrometer, the corresponding molecules or atoms to be examined are first switched into the ...

Claims

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Application Information

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IPC IPC(8): H01J49/40
CPCH01J49/40H01J49/061H01J49/401H01J29/84H01J49/425H01J49/421
Inventor 罗兰·莱曼
Owner 耶拿分析仪器股份公司
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