Unlock instant, AI-driven research and patent intelligence for your innovation.

High-speed ADDA automatic test platform

An automated testing and platform technology, which is applied in electronic circuit testing, analog/digital conversion calibration/testing, electrical measurement, etc. Effect

Inactive Publication Date: 2021-05-25
华清瑞达(天津)科技有限公司
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Disadvantages of existing technologies: low test efficiency, heavy workload, and time-consuming

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High-speed ADDA automatic test platform
  • High-speed ADDA automatic test platform
  • High-speed ADDA automatic test platform

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] Embodiments of the present invention provide a high-speed AD&DA automated testing platform, such as Figure 1-3 As shown, including host computer software 2, the input end of the host computer software 2 is fixedly provided with a switch board 3, the connection end of the switch board 3 is fixedly provided with a board card to be tested 4, and the output terminal of the switch board 3 A switch 1 is fixedly arranged, the output end of the switch 1 is fixedly provided with a spectrum analyzer 6, the input end of the spectrum analyzer 6 is connected with the board card 4 to be tested, and the output end of the switch 1 is fixedly provided with a signal source 5 , the input terminal of the signal source 5 is connected with the board card 4 to be tested.

[0023] In the present invention, high AD / DA automated test system 7 is included, and described high AD / DA automated test system 7 includes signal source control 8, spectrum analyzer control 9, document writing 10, index ca...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a high-speed AD&DA automatic test platform, and relates to the technical field of automatic test. According to the high-speed test method for each technical index of the ADC / DAC chip, upper computer software is included, a switching board is fixedly arranged at the input end of the upper computer software, a to-be-tested board card is fixedly arranged at the connecting end of the switching board, a switch is fixedly arranged at the output end of the switching board, and a frequency spectrograph is fixedly arranged at the output end of the switch. According to the high-speed test method for each technical index of the ADC / DAC chip, program codes are executed to enable the AD&DA test platform automatically operates to obtain the test result of each index of the AD&DA, it is automatically judged whether the test result is qualified or not, the test report is generated, the workload of manual test of testers is replaced by automatic test, and the test speed and efficiency are greatly improved.

Description

technical field [0001] The invention relates to the technical field of automated testing, in particular to a high-speed AD&DA automated testing platform. Background technique [0002] Digital signal processing is widely used in various fields, and ADC and DAC chips are used as communication channels between analog circuits and digital circuits, and their performance indicators play a key role in the entire signal processing system. The currently used ADC and DAC chip index test methods are as follows: ADC index test: [0003] Test environment requirements: signal source, ADC test program, vivado / ISE software (or other host computer software), ADC data analysis software, AD&DA hardware board, test process: testers pass vivado / ISE software (or other host computer software) Software) load the ADC test program into the FPGA of the hardware board, and use the signal source to provide the ADC chip with an analog signal of specified frequency and power. Next, the tester controls ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28H03M1/10
CPCG01R31/282H03M1/1071
Inventor 朱骏
Owner 华清瑞达(天津)科技有限公司