Monolithic and system-level circuit integrated package structure of terahertz microstrip probe without jumper

A technology of microstrip probe and packaging structure, which is applied in the direction of circuits, connecting devices, electrical components, etc., can solve the problems of inability to guarantee repeatability and consistency, high transmission loss, etc., to save chip thinning process and reduce loss , to eliminate the effect of large discontinuities

Active Publication Date: 2022-07-01
UNIV OF ELECTRONICS SCI & TECH OF CHINA
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

There are many forms of conversion between rectangular waveguide and planar transmission line. The commonly used ones are mainly waveguide-ridge waveguide-microstrip transition, waveguide-microstrip probe transition and waveguide-probe-microstrip transition. These traditional microwave transition structures are difficult to integrate with on-chip circuits. The test pads (pads) are directly interconnected, and in the millimeter wave and terahertz frequency bands, after interconnection with gold wire bonding wires, high transmission loss will be introduced, and good repeatability and consistency cannot be guaranteed.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Monolithic and system-level circuit integrated package structure of terahertz microstrip probe without jumper
  • Monolithic and system-level circuit integrated package structure of terahertz microstrip probe without jumper
  • Monolithic and system-level circuit integrated package structure of terahertz microstrip probe without jumper

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] In order to facilitate those skilled in the art to understand the technical content of the present invention, the content of the present invention will be further explained below with reference to the accompanying drawings.

[0038] like figure 2 and image 3 As shown in the figure, the terahertz microstrip probe monolithic and system-level circuit interconnection integrated package in this embodiment includes a lower cavity 1, an upper cavity 2, a shielding cavity 3 formed between the upper and lower cavities, and The microstrip probe is interconnected and packaged in an integrated structure 4. The upper cavity 2 is assembled on the lower cavity 1 to form a rectangular waveguide cavity 31, a microstrip circuit shielding cavity 32 and a monolithic circuit shielding cavity 33.

[0039] like image 3 , Figure 4 and Figure 5As shown, the microstrip probe interconnection package integrated structure 4 in this embodiment includes a microstrip probe 441, a probe impeda...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a terahertz jumper-free microstrip probe monolithic and system-level circuit integrated packaging structure, which is applied to the technical field of circuit packaging. The problem is that the present invention punches holes in the Pi dielectric layer above each chip pad to make a hole-shaped interconnection structure, so that the test pad is connected to the microstrip line without the traditional gold wire bonding jumper structure, and the microstrip line and the interconnection match the microstrip line. The stub connection is used to correct the impedance mismatch introduced by the hole-shaped interconnection structure. Since the hole-shaped interconnection structure and the interconnect matching microstrip stubs are made by high-precision metal atom sputtering technology, good consistency and repeatability can be guaranteed.

Description

technical field [0001] The invention belongs to the technical field of circuit packaging, and in particular relates to a terahertz monolithic and system-level circuit technology. Background technique [0002] Terahertz waves in a broad sense refer to electromagnetic waves with frequencies ranging from 100GHz to 10THz (corresponding to wavelengths of 3mm to 30um). Because terahertz waves are located in the transition zone between macroelectronics and microphotonics, they have many unique properties. Compared with microwave and millimeter waves, terahertz waves have the characteristics of high frequency and short wavelength. Therefore, terahertz waves have stronger beam directivity, higher resolution, and larger information capacity, and electronic equipment can be made smaller. Compared with light waves, terahertz waves are more penetrating and can be used in environments such as rain, fog, and smoke-filled battlefields, and have all-weather working capabilities; terahertz wa...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H01P5/107
CPCH01P5/107
Inventor 王志刚余波王俊辉延波
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products