Laser wavelength modulation measuring device, measuring method and measuring system thereof

Abstract

The invention discloses a laser wavelength modulation measuring device, a measuring method and a measuring system thereof, and relates to the technical field of laser. The laser wavelength modulation measuring device comprises a controller, a power supply, a waveform generator, a laser driving board, a laser to be measured, a single-mode fiber, an interferometer and a data collector. The power supply inputs a driving current signal to the laser driving board, and the waveform generator inputs a triangular wave modulation signal to the laser driving board; the laser driving board inputs a driving electric signal modulated by the triangular wave modulation signal to the to-be-tested laser so as to drive the to-be-tested laser to emit a laser beam and the laser beam enters the interferometer through the single-mode fiber; the interferometer interferes laser beams emitted by the laser to be measured; the data collector collects and records interference signals of the interferometer; the controller processes and analyzes the interference signal. The laser wavelength modulation measuring device is high in measuring precision and low in cost, and can solve the problem that the measuring precision is limited when a spectrum analyzer is used for measuring the laser wavelength in the prior art.

Description

technical field [0001] The invention relates to the field of laser technology, in particular to a laser wavelength modulation measurement device, a measurement method, and a measurement system. Background technique [0002] Due to the advantages of simple manufacturing, easy mass production, low cost, wide wavelength coverage, small size, long life, low energy consumption, and high electro-optic conversion efficiency, semiconductor lasers are widely used in optical fiber communication, optical storage, laser printers, and 3D sensing technologies. field has been widely applied. Among them, the measurement of wavelength modulation is a key technical indicator in the field of semiconductor laser manufacturing, which can be used to evaluate the optical performance of semiconductor lasers and to guide processing and manufacturing processes. [0003] At present, the method of measuring the wavelength modulation of laser light source is usually LIV (spectrum-power-voltammetry char...

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Problems solved by technology

[0004] The object of the present invention is to provide a laser wavelength modulation measurement device, its measurement method, and measurement system, which can provide a laser wavelength modulation measurement device with high measurement accuracy and low cost, so as to solve the problem of using spectrum analyzers in the prior art. When measuring laser wavelength, its measurement accuracy is limited

The laser wavelength modulation measurement device can provide a laser wavelength modulation measurement device with high measurement accuracy and low cost, so as to solve the problem of limited measurement accuracy when a spectrum analyzer is used to measure laser wavelength in the prior art

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