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High-FREQUENCY POWER-AMPLIFYING ELEMENT

A technology of power amplification and components, applied in the field of high-frequency power amplification components, can solve the problems of high-frequency signal bipolar transistor current concentration, ineffectiveness, breakdown, etc.

Pending Publication Date: 2021-08-20
MURATA MFG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The structure of the high-frequency power amplifying element disclosed in Patent Document 1 can suppress thermal runaway caused by non-uniformity of the DC component of the collector current among a plurality of bipolar transistors. Such aspects as breakdown caused by unevenness of collector current are not effective
Especially when the load impedance becomes small and the output impedance does not match, the current concentration to a specific bipolar transistor tends to occur when the amplitude of the high-frequency signal increases.

Method used

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Examples

Experimental program
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Effect test

no. 1 example

[0042] refer to Figure 1 to Figure 5 , the high-frequency power amplifying element of the first embodiment will be described.

[0043] figure 1 is an equivalent circuit diagram of a power amplifying module 50 including the high-frequency power amplifying element 20 of the first embodiment. The power amplifying module 50 includes: a high-frequency power amplifying element 20 composed of a monolithic microwave integrated circuit (MMIC), inductors 51 and 52 connected to the high-frequency power amplifying element 20 and an output matching circuit 53 . The high frequency power amplifying element 20 includes a first amplifying circuit 21 , a second amplifying circuit 22 , an input matching circuit 23 , an interstage matching circuit 24 , a first bias circuit 25 and a second bias circuit 26 . There are cases where the first amplifier circuit 21 and the second amplifier circuit 22 are called an input stage amplifier circuit and an output stage amplifier circuit, respectively.

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no. 2 example

[0126] Next, refer to Figure 7 The high-frequency power amplifying element of the second embodiment will be described. Below, for Figure 1 to Figure 4 The description of the structure common to the high-frequency power amplifying element 20 of the first embodiment shown in the drawings is omitted.

[0127] Figure 7 is the second amplifying circuit 22 ( figure 1 ) is a diagram showing the positional relationship in plan view of each component of the bipolar transistor 41 included in ). In the first embodiment, the shapes of the emitter mesa layer 62 and the emitter electrode 63E in plan view are substantially rectangular. On the other hand, in the second embodiment, the emitter mesa layer 62 and the emitter electrode 63E have a shape in which both ends of a rectangle are thinner than the central portion in plan view.

[0128] Therefore, the interval between the fingers 63B1F of the first base electrode 63B1 and the emitter mesa layer 62 is not constant. In this case, t...

no. 3 example

[0134] Next, refer to Figure 8A as well as Figure 8B The high-frequency power amplifying element of the third embodiment will be described. Below, for Figure 1 to Figure 4 The description of the structure common to the high-frequency power amplifying element 20 of the first embodiment shown in the drawings is omitted.

[0135] Figure 8A is the first amplifying circuit 21 ( figure 1 ) is a diagram showing a planar arrangement of components of one bipolar transistor 31 included in the plurality of bipolar transistors 31 . Figure 8B is the second amplifying circuit 22 ( figure 1 ) is a diagram showing a planar arrangement of components of one bipolar transistor 41 included in the plurality of bipolar transistors 41 .

[0136] In the first embodiment ( figure 2 A. figure 2 In B), the first base electrode 63B1 is connected to the first base lead wiring 64B1, and the second base electrode 63B2 is connected to the second base lead wiring 64B2. In contrast, in the thir...

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Abstract

The invention provides a high-frequency power amplifying element capable of improving breakdown withstand voltage when the amplitude of an input signal is increased. A first amplifier circuit in a preceding stage, a second amplifier circuit in a subsequent stage, and a ground external connection terminal are disposed on a substrate. The first and second amplifier circuits each include bipolar transistors, capacitive elements for the respective bipolar transistors, and resistive elements for the respective bipolar transistors. The bipolar transistors each include separate base electrodes, that is, a first base electrode for high frequency and a second base electrode for biasing. The bipolar transistors of the second amplifier circuit include emitter electrodes connected to the ground external connection terminal. The minimum spacing between the first base electrode and an emitter mesa layer of at least one of the bipolar transistors of the second amplifier circuit is greater than the minimum spacing between the first base electrode and the emitter mesa layer of each of the bipolar transistors of the first amplifier circuit.

Description

technical field [0001] The present invention relates to a high-frequency power amplifying element. Background technique [0002] A high-frequency power amplifying element for mobile communication uses, for example, a heterojunction bipolar transistor (HBT). Patent Document 1 below discloses a high-frequency power amplifying element capable of preventing thermal runaway. The high-frequency power amplifying element disclosed in Patent Document 1 has a two-stage structure of an input-stage amplifying circuit and an output-stage amplifying circuit. The output stage amplifying circuit includes a plurality of bipolar transistors connected in parallel to each other. The bipolar transistors each have an emitter layer disposed on the base layer, a DC base electrode for supplying a DC bias, and an RF base electrode for supplying a high-frequency signal. An emitter electrode is arranged on the emitter layer. [0003] The emitter electrode is arranged at a position sandwiched betwee...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03F1/52
CPCH03F1/52H03F3/19H03F2200/451H03F3/211H03F1/302H03F1/0261H03F2203/21131H03F3/195H01L23/66H01L2223/6655H01L23/64
Inventor 梅本康成马少骏小屋茂树
Owner MURATA MFG CO LTD