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High-precision stokes-mueller channel spectral polarization detection system

A detection system, high-precision technology, applied in the field of optical measurement, can solve problems such as inability to achieve optimal solutions, system calibration difficulty, system full error calibration, etc., to avoid iterative loops or premature termination of iterations, accurate spectral reconstruction Results, Reconstruction Results Accurate Effects

Active Publication Date: 2022-07-05
BEIJING INSTITUTE OF TECHNOLOGYGY
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Problems solved by technology

However, in order to achieve high-precision Stokes-Mueller spectrum detection, there are two major difficulties in this technology: one is the full error calibration of the system
There are not only strong polarizing devices such as wave plates and polarizers in the spectropolarimeter, but also weak polarizing devices such as optical fibers and gratings in the spectrometer. The errors of these devices affect the measurement accuracy, and these error sources are numerous and have complex interactions. bring difficulty
At present, there is a lack of convenient, fast and accurate full error calibration technology
Second, it is difficult to reconstruct Stokes-Mueller spectrum with high precision
Patent ZL2019 1 0766902.9 proposes a data reconstruction method for spectral polarization systems, but the cutoff conditions for iterative optimization are not clear
The cut-off condition of the iteration greatly affects the reconstruction accuracy. If the number of iterations is too small, the optimal solution cannot be reached, and if the number of iterations is too large, it will increase the useless calculation amount and time.

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  • High-precision stokes-mueller channel spectral polarization detection system
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Embodiment Construction

[0033] The present invention will be described in detail below with reference to the accompanying drawings and embodiments.

[0034] The invention provides a high-precision Stokes-Mueller channel spectral polarization detection system, such as figure 1 As shown, the time-domain modulation Mueller spectropolarimeter is described by taking the double-rotating wave plate Mueller spectropolarimeter as an example.

[0035] when figure 1 When only light source 1, spectral polarization state analyzer 5, and spectrometer 7 are present in the device, it is a Stokes channel spectral polarimeter. For example, the spectral polarization state analyzer 5 is composed of a 5 mm thick quartz crystal with a fast axis horizontal, a 10 mm thick quartz crystal with a fast axis of 45°, and a polarizer with a light transmission axis horizontal. Spectrometer 7 is a grating spectrometer.

[0036] when figure 1 When only the light source 1, the spectral polarization state generator 3, the spectral ...

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Abstract

The invention discloses a high-precision Stokes-Mueller channel spectral polarization detection system. The system includes a light source, a polarizer, a wave plate and a spectrometer. By measuring and constructing the instrument matrix of the Stokes-Mueller channel spectral polarization detection system, all errors of the system can be realized. high-precision calibration; factors such as calibration accuracy, measurement noise, etc. are considered during reconstruction, and the residual threshold is set adaptively, so that the optimization iteration stops at a suitable place to obtain high-precision reconstruction results; the calibration and reconstruction of the present invention The high precision of the Stokes‑Mueller channel spectral polarization detection system is guaranteed.

Description

technical field [0001] The invention belongs to the technical field of optical measurement, in particular to a high-precision Stokes-Mueller channel spectral polarization detection system. Background technique [0002] Polarization is an important property of light, and polarized light is very sensitive to microstructural properties in samples such as optical components, materials, and biological tissues. The interaction of light with the sample will cause refraction, reflection, scattering and other processes to change the polarization state of the incident light. The polarization state of the beam is represented by the Stokes vector, and the change of the polarization state of the light by the sample is represented by the Mueller matrix. The Mueller matrix contains all the polarization information of the sample, which can be further decomposed into depolarization, phase retardation, dichroism, fast axis orientation angle, optical rotation, etc., which are closely related ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/447G01J3/02G01J4/00
CPCG01J3/447G01J3/0224G01J3/0229G01J4/00G01J4/04
Inventor 李艳秋周国栋
Owner BEIJING INSTITUTE OF TECHNOLOGYGY
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