Terahertz linear array radar scanning imaging system and method for nondestructive testing

Abstract

The invention discloses a terahertz linear array radar scanning imaging system and method for nondestructive testing. The system employs a multi-input and multi-output one-dimensional sparse linear array, combines a waveguide antenna with the one-dimensional sparse linear array, reduces the array element spacing in the one-dimensional sparse linear array through the waveguide antenna, enables the equivalent linear array arrangement of the one-dimensional sparse linear array to be more compact, and improves the transverse imaging resolution. Meanwhile, the waveguide antenna is driven by the two-dimensional moving frame to scan, so a three-dimensional shape image of the non-dielectric composite material to be detected can be obtained, and meanwhile, the first target image is reconstructed through a preset super-resolution image reconstruction model; therefore, a high-precision transverse resolution image which can be obtained only at a high frequency band originally can be obtained at a lower frequency band, hardware cost is reduced, and a technical problem that defects are difficult to detect accurately due to the fact that the imaging resolution of an imaging system in the prior art on a non-dielectric composite material is lower is solved.

Description

technical field [0001] The present application relates to the technical field of terahertz imaging, in particular to a terahertz linear array radar scanning imaging system and method for non-destructive testing. Background technique [0002] Non-dielectric composite materials such as FRP, thermal insulation tiles, ceramics, resins, plastics, etc., usually have the following defects inside: defects such as bubbles, delamination, fractures, etc., depending on the size of the defect, ranging from a few centimeters to several millimeters in size. [0003] In the prior art, when detecting defects in non-dielectric composite materials, high-frequency millimeter-wave / terahertz sources are usually used for defect imaging detection, but the energy of high-frequency millimeter-wave / terahertz sources is low, and Poor penetration, which makes imaging non-dielectric composites with low resolution, making it difficult to accurately detect defects. Contents of the invention [0004] Thi...

AI Technical Summary

Problems solved by technology

[0004] This application provides a terahertz linear array radar scanning imaging system and method for non-destructive testing, which is used to solve the problem that the imaging system in the prior art has a low resolution for imaging non-dielectric composite materials, making it difficult to accurately detect defects. technical problem

Images