XRD (X-Ray Diffraction) method for determining wire texture

Abstract

The invention discloses an XRD (X-Ray Diffraction) method for determining a wire texture, and belongs to the technical field of wire texture determination. The method comprises the following steps: processing a wire material and a blocky standard sample thereof into different layers of cylindrical samples during measurement, measuring textures of diffraction peaks of the samples, recording highest strength data and texture types of the textures of different layers, and calculating a highest strength average value max1 of the different layers; and respectively cutting a plate-shaped test sample and a standard sample, carrying out whole-body texture measurement on the test sample and the standard sample, recording the highest strength max and the texture type, judging the overall texture range of the wire rod, and comparing the maximum strength max and the texture type max in the same texture strength interval and the texture type matched with max1, thereby verifying that the method has extremely high accuracy. According to the determination method, the texture information integrity of the wire rod sample is guaranteed to a great extent, the texture change rule of the wire rod from the surface layer to the core part is accurately determined, and more research and guidance bases are provided for the deformation state, process improvement, mechanical property and microstructure analysis of the wire rod.

Description

Technical field: [0001] The invention belongs to the technical field of wire texture measurement, and in particular relates to an XRD method for measuring wire texture. Background technique: [0002] The orientation distribution of each grain in an ideal polycrystalline material is irregular, so it shows "isotropy" macroscopically. In fact, polycrystalline materials often have preferred orientations related to their preparation and processing, that is, the orientation of each grain is segregated towards one or several specific directions. This organizational state is called texture. Texture makes the mechanical and physical properties of polycrystals anisotropic, which may have a harmful effect on the material, but it can also be used as a strengthening method for some materials. Therefore, it is the core of material research to measure the texture and give it a certain index. an important method. [0003] At present, X-ray diffraction (XRD) and electron backscattering dif...

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Problems solved by technology

[0013] The purpose of the present invention is to overcome that the wire rods in the above-mentioned prior art are easy to form different texture components due to the different deformation states of the surface layer, subsurface layer and core, and the traditional XRD method and EBSD method cannot meet the wire rod texture measurement requirements. Insufficient to provide an XRD method for measuring the texture of the wire, which can accurately measure the texture change law of the wire from the surface to the core

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