Power device testing device
A test device and power device technology, applied in the field of testing, can solve the problems of low cost performance and low test efficiency, and achieve the effects of low cost, flexible testing, and small footprint
Pending Publication Date: 2021-11-19
INVENTCHIP TECH CO LTD
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Problems solved by technology
[0003] At present, the avalanche withstand reliability test of power devices in related technologies usually requires a separate test device to test various types of power devices separately, which is not cost-effective and the test efficiency is not high
Method used
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[0047] Various exemplary embodiments, features, and aspects of the present disclosure will be described in detail below with reference to the accompanying drawings. The same reference numbers in the figures indicate functionally identical or similar elements. While various aspects of the embodiments are shown in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.
[0048] In describing the present disclosure, it should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", The orientation or positional relationship indicated by "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present disclosure and simplifying the description, and It is not to indicate or imply that a device or element referred to must have a particular orientation, be constructed, or o...
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The invention relates to a power device testing device, and the device comprises a testing module which comprises a first substrate and a second substrate, wherein the first substrate comprises a first interface, the second substrate comprises a second interface, the first interface is used for accessing a transistor, and the second interface is used for accessing a diode, and the first interface is connected to the second interface; a control module connected to the first interface and used for testing the avalanche tolerance of a transistor to be tested when the transistor to be tested is connected to the first interface and the diode is not connected to the second interface; or testing the avalanche tolerance of a diode to be tested when the first interface is connected to a preset transistor and the second interface is connected to the diode to be tested. According to the embodiment of the invention, one testing device can be used for rapidly, accurately, efficiently and flexibly testing the avalanche tolerance of various power devices, the cost is low, and the occupied space is small.
Description
technical field [0001] The present disclosure relates to the technical field of testing, in particular to a power device testing device. Background technique [0002] Power devices are the basis for the development of modern power electronics technology, and are also the core devices for power conversion in the electrification industry. SiC power devices are the third-generation wide-bandgap semiconductor power devices, and their performance is superior to silicon-based semiconductor power devices in all aspects. , and the reliability of the device is its core competitiveness, and its quality is directly related to the quality of the entire power electronic product. In power electronics applications of SiC power devices, due to the presence of inductive loads and stray inductance in the circuit, the back EMF generated by rapid changes in di / dt may force SiC power devices to undergo avalanche breakdown and even damage the devices. The unclamped inductive switching (Unclamped...
Claims
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Patent Timeline
Login to View More IPC IPC(8): G01R31/26
CPCG01R31/2601
Inventor 杨海龙王庆
Owner INVENTCHIP TECH CO LTD