Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Magnetic field gradient measurement method and atomic magnetic gradiometer system

A measurement method and technology of magnetic field gradient, applied in the field of magnetic field gradient measurement method and atomic magnetic gradiometer system, can solve the problems of inaccurate magnetic field measurement, unfavorable magnetic field precision measurement, large influence of common mode noise, etc., and achieve high sensitivity and power consumption. The effect of low, increasing polarization

Pending Publication Date: 2021-11-19
SOUTH UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In view of the above-mentioned deficiencies in the prior art, the purpose of the present invention is to provide a magnetic field gradient measurement method and an atomic magnetic gradient meter system, which solves the problem that the common mode noise in the prior art has a large influence, making the measurement of the magnetic field by the atomic magnetometer inaccurate , which is not conducive to the precise measurement of the magnetic field

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Magnetic field gradient measurement method and atomic magnetic gradiometer system
  • Magnetic field gradient measurement method and atomic magnetic gradiometer system
  • Magnetic field gradient measurement method and atomic magnetic gradiometer system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0057] The present invention provides a magnetic field gradient measurement method and an atomic magnetic force gradiometer system. In order to make the purpose, technical solution and effect of the present invention clearer and clearer, the present invention will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0058] The basic working principle of the all-optical atomic magnetometer is as follows: First, a beam of laser light is irradiated on the alkali metal atomic gas, and the atoms are pumped, so that the atoms are redistributed on the magnon energy level, and the macroscopic appearance is atomic With a certain polarization orientation, this process is the preparation process of the polarized state of the atom; then the polarized atoms will undergo Larmor precession around th...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a magnetic field gradient measurement method and an atomic magnetic gradiometer system. The method comprises the steps of controlling a light modulator to process laser, and obtaining pump light and probe light, controlling a light modulator to periodically modulate the pump light to obtain modulated pump light with a modulation signal, controlling the signal detector to receive second change detection light obtained after the detection light sequentially passes through the Larmor advance action of the first polarization state atom and the Larmor advance action of the second polarization state atom, and acquiring a polarization rotation angle signal of the second change detection light, demodulating a polarization rotation angle signal of the first change detection light, calculating to obtain the value of a first external magnetic field to be measured according to the frequency of the modulation signal, and acquiring the magnetic field intensity at the first polarization state atom at the same time. The sensitive and compact method for simultaneously measuring the magnetic field intensity and the magnetic field gradient is realized, common-mode noise in magnetic field gradient measurement can be inhibited, and the sensitivity and the precision of magnetic field gradient measurement are improved.

Description

technical field [0001] The invention relates to the field of magnetic field measurement, in particular to a magnetic field gradient measurement method and an atomic magnetic force gradient meter system. Background technique [0002] Magnetic field detection has a wide range of needs in the fields of resource exploration, geophysics, nondestructive testing, biomedicine, national defense and military, and basic science. The magnetic field gradiometer measures the difference in magnetic field size at different positions in space, which can provide more accurate information about the measured object. information. At the same time, the magnetic field gradiometer can suppress common mode noise and improve the measurement sensitivity and accuracy of the magnetic field signal to be measured by distinguishing between the background magnetic field and the signal magnetic field. As a new type of magnetic field detection device, the atomic magnetometer and the atomic magnetic gradient ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R33/022G01R33/032
CPCG01R33/022G01R33/032Y02A90/30
Inventor 徐晓天杨胜军范靖云
Owner SOUTH UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products