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A conductive tape contact resistance testing system and testing method

A technology of conductive tape and contact resistance, applied in the direction of grounding resistance measurement, measuring resistance/reactance/impedance, measuring devices, etc., which can solve the problems of horizontal distinction and comparison, without many problems, and achieve stable and reliable data, easy processing, and simple structure Effect

Active Publication Date: 2022-01-25
成都佳驰电子科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

So how to test the contact resistance of the conductive tape, and whether to distinguish and compare different materials horizontally, there are not many methods at this stage

Method used

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  • A conductive tape contact resistance testing system and testing method
  • A conductive tape contact resistance testing system and testing method
  • A conductive tape contact resistance testing system and testing method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment example 1

[0028] A conductive tape contact resistance test system, the test frequency covers the frequency band from 500MHz to 2GHz, and the test instrument is Agilent E5071. The test calibration parts include microstrip transmission module 1 and standard calibration parts. The microstrip transmission module 1 has a length of 20cm, a width of 6cm, and a thickness of 1.6mm. The bottom is covered with copper, and the width of the upper microstrip line is 6mm. The dielectric board is made of FR4 material, such as figure 1 shown. The microstrip transmission module 1 has two reciprocal ports, which are connected by an SMA connector with an inner diameter of 3.5 mm, one port is connected to a test instrument, and the other port is connected to a standard calibration piece. The standard calibration parts are vector network analyzer standard mechanical calibration parts 85052D, including open circuit calibration parts, short circuit calibration parts, and 50 ohm load calibration parts.

[002...

Embodiment example 2

[0032] A method for testing the contact resistance of a conductive adhesive tape comprises three steps: system calibration, application of test samples 5, and parameter testing.

[0033] System calibration: debug the test instrument to the frequency band to be tested, connect the first port of the microstrip transmission module 1 in the test calibration kit to the port of the test instrument, and perform single-port calibration on the end of the second port to the system. After the calibration is completed, the second port of the microstrip transmission module 1 in the calibration piece is connected to the pendant module 4, and the Smith chart curve is called out, so that the Smith chart curve has only an arc within half a circle, and is in the upper half area, and Record the impedance parameter data of the pendant module 4.

[0034] Apply test sample 5: Cut the conductive tape to be tested into a size of 20.4mm×6mm, and apply it to the two rectangular gaps in the test module ...

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Abstract

The invention relates to a conductive tape contact resistance test system and a test method. The conductive tape contact resistance test system includes a test instrument, a test calibration part, a test module and a pendant module. Test calibration parts include microstrip transmission module and standard calibration parts. The shape and structural dimensions of the test module are the same as those of the microstrip transmission module in the test calibration kit, and have dual ports. On the microstrip line conductor in the microstrip transmission line of the test module, open rectangular slots, the number of slots is 1 to 10, and the edges of the rectangular slots have a comb structure. The pendant module is a single-port short-circuit module, and the short-circuit module forms a high-frequency inductance. Cut the conductive tape to be tested to the size of the rectangular slot of the test module, or slightly larger than the size of the slot, and apply it to the slot in the test module. Read the data and record it, then you can test the high-frequency contact resistance of the conductive tape.

Description

technical field [0001] The invention relates to the field of high-frequency contact resistance testing, in particular to a conductive tape contact resistance testing system and testing method. Background technique [0002] In recent years, with the continuous advancement of electronic technology, electronic equipment has gradually developed in the direction of miniaturization, thinning, and modularization. Further, with the application of 5G communication technology, electronic equipment is increasingly developing towards multi-band and broadband integrated applications. However, this development trend has undoubtedly greatly increased the difficulty of designing and manufacturing electronic equipment, and the mutual interference and compatibility of multiple frequency bands have also become key difficulties in the integrated design of electronic equipment. [0003] Due to the integrated design of the multi-functionality of electronic equipment, electronic equipment is grad...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/20
CPCG01R27/205
Inventor 李维佳余艳萍艾之深谢海岩张宏亮陈良
Owner 成都佳驰电子科技股份有限公司