Double-slit long-wave infrared spectrometer, optical system thereof and optical system design method
A technology of infrared spectrometer and optical system, which is applied in the field of double-slit long-wave infrared spectrometer and its optical system, and optical system design, which can solve the problem of low-temperature long-wave infrared spectrometer system complexity and volume increase, difficulty in ensuring reliability, long design cycle, etc. problem, to achieve the effect of low manufacturing difficulty, small quality and small volume
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[0044] Relevant terms involved in the present invention are explained as follows:
[0045] Background radiation: When the infrared detection system observes the target, the target radiation will enter the image plane 6 together with other radiation, and the radiation other than the target is defined as the background radiation.
[0046] Spectrometer: A device that uses a photodetector to measure the intensity of spectral lines at different wavelengths. The structure generally includes a slit, a collimation system, a dispersion system, a converging system, and a photodetector.
[0047] Cryogenic optical system: A special optical system that can work normally in a wide temperature range and maintain diffraction-limited imaging.
[0048]The present invention applies inclined double slits to the design of the optical system of the long-wave infrared spectrometer in a low-temperature environment, and designs a new type of spectrometer. In an embodiment of the present invention, it ...
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