Double-slit long-wave infrared spectrometer, optical system thereof, and optical system design method
A technology of infrared spectrometer and optical system, which is applied in the field of optical system design, double-slit long-wave infrared spectrometer and its optical system, and can solve the problem of low-temperature long-wave infrared spectrometer system complexity and volume increase, difficulty in ensuring reliability, long design cycle, etc. problem, to achieve the effect of low manufacturing difficulty, small quality and small volume
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[0044] The relevant terms involved in the present invention are explained as follows:
[0045] Background radiation: When the infrared detection system observes the target, the target radiation will enter the image plane 6 together with other radiation, and the radiation other than the target is defined as background radiation.
[0046] Spectrometer: a device that measures the intensity of spectral lines at different wavelength positions with a photodetector. The structure generally includes a slit, a collimation system, a dispersion system, a convergence system and a photodetector.
[0047] Low temperature optical system: A special optical system that can work normally in a wide temperature range and maintain diffraction-limited imaging.
[0048]The present invention applies the inclined double slit to the design of the optical system of the long-wave infrared spectrometer in a low temperature environment, and designs a new type of spectrometer. At the same time, it can be a...
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