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High-resolution microscopic imaging method based on multi-angle illumination deconvolution

A micro-imaging, high-resolution technology, applied in microscopes, optics, instruments, etc., can solve problems such as low signal-to-noise ratio and failure to achieve diffraction-limited resolution, and achieve good imaging effects, accurate results, and high imaging resolution Effect

Pending Publication Date: 2021-12-07
南京理工大学智能计算成像研究院有限公司
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Problems solved by technology

[0010] The purpose of the present invention is to solve the problem that the diffraction-limited resolution cannot be reached due to the low signal-to-noise ratio at the cutoff frequency under traditional Kohler illumination

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  • High-resolution microscopic imaging method based on multi-angle illumination deconvolution
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Embodiment Construction

[0032] In order to make the purpose, technical solutions and advantages of the present application more clearly understood, the present application will be described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application, but not to limit the present application.

[0033] combine figure 1 , this embodiment is a high-resolution microscopic imaging method based on multi-angle illumination deconvolution, including the following steps:

[0034] Step 1: Intensity image acquisition under multi-angle illumination. The programmable LED array is used as the illumination light source of the system, and the LED units are sequentially lit. The central unit of the LED array must be aligned with the optical axis of the imaging system. At the same time, the monochromatic or color camera starts exposure after receiving the synchronous trigger ...

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Abstract

The invention discloses a high-resolution microscopic imaging method based on multi-angle illumination deconvolution. Different from a Kohler illumination mode adopted by a traditional bright field microscope, the system adopts an LED array as an illumination light source, and object information of different spatial frequency components is obtained by sequentially collecting object images at different illumination angles; then, intensity transfer functions corresponding to different illumination angles are calculated according to system parameters, and least square deconvolution reconstruction is carried out on the image. Compared with a traditional imaging method for simultaneously acquiring all spatial frequency information through a bright field microscope, the method has higher robustness to noise by using a least square deconvolution algorithm.

Description

technical field [0001] The invention belongs to optical microscopic imaging technology, in particular to a high-resolution microscopic imaging method based on multi-angle illumination deconvolution. Background technique [0002] Since Leeuwenhoek first observed cells with a hand-made microscope more than 300 years ago, human beings have carried out many explorations in the field of microscopic imaging. Among them, high-resolution microscopic imaging for the purpose of seeing more clearly and finely is an important part. In 1873, Abbe published the diffraction imaging theory of microscopes in the German Journal of Microscopy, and made a scientific explanation of the imaging process of microscopes. He proposed for the first time that the optical resolution of microscopes was limited, which was limited by the value of the objective lens (Zhang Xiangxiang. Modern Microscopy). Review of Imaging Technology [J]. Optical Instruments, 2015(6):550-560.). [0003] In bright-field mic...

Claims

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Application Information

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IPC IPC(8): G02B21/36G02B21/06
CPCG02B21/365G02B21/367G02B21/06
Inventor 张晓磊左超孙佳嵩胡岩沈德同尹维
Owner 南京理工大学智能计算成像研究院有限公司
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