Parallel electron beam detection system based on nanometer electron source
A detection system and electron source technology, which is applied in the direction of material analysis, measuring devices, and instruments using wave/particle radiation, can solve problems such as low detection efficiency, damage to inspected materials, inspected devices, and increased electronic Coulomb force. Achieve high electron emission rate, improve efficiency, and small curvature radius
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Embodiment 1
[0017] Such as figure 1 As shown, the parallel electron beam detection system based on the nano-electron source of the present invention includes a nano-array electron source 11, an accelerating electrode array 12, a sample stage 13, an objective lens 14, a correcting mirror 15, a detector 16, and the like arranged in sequence. The nano-array electron source 11 emits multiple beams of electrons under the pull of the accelerating electrode based on the field emission effect, the accelerating electrode array 12 accelerates the multiple beams of electrons emitted by the nano-array electron source 11 to a certain energy, and the sample stage 13 receives the multiple beams of electrons and makes the electrons penetrate In order to obtain the internal structure information of the sample, the objective lens 14 and the correcting mirror 15 form an electron optical system, which focuses the electrons passing through the sample and images them to the detector 16 at a fixed zoom ratio.
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Embodiment 2
[0021] The electron beam detection system of the present invention is not limited to the transmission imaging system, and can also be applied to the electron beam detection system based on the secondary electron emission system. The electrons emitted by the nano-array electron source 21 are bombarded to be tested after passing through the accelerating pole and focusing by the electron optical system. The surface of the device 25 , the secondary electrons emitted from the surface 25 of the device to be tested are collected by the electron optical system and imaged at the detector 28 .
[0022] Such as figure 2 As shown, the parallel electron beam detection system based on the nano-electron source of the present invention includes a nano-array electron source 21, an accelerating electrode array 22, a first electron optical unit, a second electron optical unit and a detector 28; the first electron optical unit includes The first objective lens 23, the first correcting mirror 24;...
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