Processing method and system for improving yield of embedded Flash

A processing method and embedded technology, applied in the direction of memory system, electrical digital data processing, data processing input/output process, etc., can solve the problem of high failure rate of Flash, achieve the effect of improving yield rate and ensuring correctness

Pending Publication Date: 2022-02-01
CHINA KEY SYST & INTEGRATED CIRCUIT
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a processing method and system for improving the yield rate of embedded Flash, to solve the problem that the failure rate of Flash is too high due to process manufacturing

Method used

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  • Processing method and system for improving yield of embedded Flash
  • Processing method and system for improving yield of embedded Flash
  • Processing method and system for improving yield of embedded Flash

Examples

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Embodiment 1

[0027] The invention provides a processing system for improving the yield rate of embedded Flash, its structure is as follows figure 1 As shown, the redundant page replaces the bad page of Flash, and the read and write operations of the bad page of Flash by the system bus are all mapped to the redundant page, and there is no difference in the use of the user.

[0028] This processing system comprises redundant page, redundant page enabling bit, redundant page address register and address mapping controller; Described redundant page is used for replacing the bad page in Flash, in case Flash bad page occurs, system bus will The reading and writing of bad pages are all mapped to the reading and writing of redundant pages to ensure the correctness of data reading and writing; the redundant page enabling bit indicates whether the redundant page replacement corresponding to the enabling bit is effective, when the bit When the value is 1, it means that the replacement of the redundan...

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PUM

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Abstract

The invention discloses a processing method and system for improving the yield of embedded Flash, and belongs to the field of integrated circuits. The method comprises the following steps of: after erasing the Flash, performing write operation and read operation on each page of the Flash, judging whether the page is a normal page or a bad page, and directly writing a page address of the bad page into a redundant page address register when the bad page appears; when the system bus accesses the Flash, comparing the address accessed by the system bus with the median of the address register of the redundant page, and if the comparison result is inconsistent, indicating that the system bus accesses the normal page at the moment, and the redundant page does not need to be accessed; if the comparison result is consistent, indicating that the system bus accesses a bad page at the moment, setting a redundant page enabling position, and directly skipping the bad page by the system bus to access a redundant backup page; when the enable bit of the redundant page is 1, indicating that the replacement of the bad page by the redundant page takes effect, and the read-write operation of the system bus on the Flash bad page is mapped to the redundant page.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to a processing method and system for improving the yield rate of embedded Flash. Background technique [0002] Embedded Flash is used more and more widely in MCU (microcontroller Unit, microcontroller) and DSP (Digital Signal Process, digital signal processor), and almost all MCUs and DSPs have embedded Flash. Since the written data needs to be maintained for a long time without loss, the design and manufacturing process of embedded Flash is relatively complicated, which has become the main source of failure of the entire circuit. According to statistics, the failure of embedded Flash accounts for more than one-third of the failure of the entire circuit. [0003] The failure of the embedded Flash will cause the system to store and read data errors, and then cause the entire system to run incorrectly. Therefore, the yield rate of embedded Flash directly affects the yie...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F12/02G06F12/14G06F12/16G06F3/06
CPCG06F12/0246G06F12/1425G06F12/16G06F3/0607G06F3/0619G06F3/0652G06F3/0679
Inventor 杨晓刚朱樟明魏敬和鲍宜鹏苗韵
Owner CHINA KEY SYST & INTEGRATED CIRCUIT
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