Electric aging test time determination method and device and computer storage medium
A technology of test time and determination method, applied in the field of screening test, can solve problems such as affecting production cycle, increasing production cost, excess quality and reliability, etc., and achieve the effect of reducing excess degree, shortening production cycle and cost
Active Publication Date: 2022-03-11
ZHEJIANG GEESPACE TECH CO LTD +1
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Problems solved by technology
Commercial satellites need to pay more attention to cost while considering reliability requirements. Due to the operation mode of short-cycle mass production, products are rolled into production and iterated quickly. Therefore, the electrical aging of semiconductor devices selected by commercial satellites with different life requirements refers to the same test. Time requirements will inevitably lead to excess quality and reliability. Too much energy and resources will be invested in the electrical aging of devices, which will inevitably affect the production cycle and greatly increase production costs. This approach is not suitable for commercial aerospace production models.
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[0045] It should be noted that, in this document, the term "comprising", "comprising" or any other variation thereof is intended to cover a non-exclusive inclusion such that a process, method, article or apparatus comprising a set of elements includes not only those elements, It also includes other elements not expressly listed, or elements inherent in the process, method, article, or device. Without further limitations, an element defined by the phrase "comprising a..." does not exclude the presence of other identical elements in the process, method, article, or device that includes the element. In addition, different embodiments of the present invention Components, features, and elements with the same name in the example may have the same meaning, or may have different meanings, and the specific meaning shall be determined based on the explanation in the specific embodiment or further combined with the context in the specific embodiment.
[0046]It should be understood that ...
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The invention discloses an electric burn-in test time determination method and device and a computer storage medium. The electric burn-in test time determination method comprises the steps of obtaining a working life coefficient, a critical degree coefficient and a reliability design coefficient of a device; according to the working life coefficient, the critical degree coefficient and the reliability design coefficient of the device, respectively obtaining corresponding relations between the electric aging test time of the device and the working life coefficient, the critical degree coefficient and the reliability design coefficient; and determining the electric burn-in test time of the device according to the corresponding relationship between the electric burn-in test time of the device and the working life coefficient, the critical degree coefficient and the reliability design coefficient. According to the electric aging test time determination method and device and the computer storage medium provided by the invention, the electric aging test time is determined according to the actual application condition of the device, the excess degree of the quality and reliability of the device can be effectively reduced, and the production cycle and cost are reduced.
Description
technical field [0001] The invention relates to the technical field of screening tests, in particular to a method, device and computer storage medium for determining the time of an electric aging test. Background technique [0002] Due to the non-repairable characteristics of satellites when they are in orbit, satellites have extremely high requirements for their reliability. Screening the selected components before installation, discovering potential defects and eliminating defective products is the key to ensuring the reliability of satellites. One of the important work links of sex. Among them, electrical burn-in is a commonly used screening method for semiconductor devices used in satellites. Based on the failure laws of commonly used semiconductor devices, they basically conform to the "bathtub curve" (that is, the early failure rate of the device decreases with time, but the failure rate refers to a certain instantaneous failure rate. The probability of failure in the...
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IPC IPC(8): G06F30/20G06F111/10G06F111/08G06F119/02G06F119/04G06F119/12
CPCG06F30/20G06F2111/10G06F2111/08G06F2119/02G06F2119/04G06F2119/12Y02P90/30
Inventor 张逸凡张华刘勇郝星凯钱永旺
Owner ZHEJIANG GEESPACE TECH CO LTD
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