Device, method and system for testing performance parameters of thin-film thermoelectric material

Abstract

The invention relates to a device, a method and a system for testing performance parameters of a thin-film thermoelectric material, which are used for solving the problems that the traditional thermoelectric performance parameter testing method is complicated in operation, low in testing speed and low in testing accuracy, and the rapid and simple testing of the performance parameters of a large number of thin-film thermoelectric materials is difficult to meet. The testing device comprises a basic temperature control unit and a temperature difference control unit which are arranged from bottom to top, the basic temperature control unit is used for controlling the basic temperature of the sample to be tested; the temperature difference control unit is used for controlling the temperature difference between two ends of the to-be-tested sample; the temperature difference control unit comprises a to-be-tested sample bearing part, and the to-be-tested sample bearing part is used for bearing a to-be-tested sample. According to the technical scheme provided by the invention, the thermoelectric performance parameters of the thin-film thermoelectric material can be simply, quickly and accurately tested, and the thermoelectric performance parameters of the thin-film thermoelectric material can be automatically processed.

Description

technical field [0001] The invention belongs to the technical field of thermoelectric testing, and in particular relates to a device, method and system for testing performance parameters of thin-film thermoelectric materials. Background technique [0002] Thermoelectric materials are special functional materials that can directly convert heat and electricity, providing a simple and effective way to utilize waste heat and natural heat. As an energy conversion material, thermoelectric materials have the advantages of compact structure, small size, no moving parts, no noise, no excrement (no pollution), and high reliability. Temperature difference power generation, self-powered sensors, etc. have been widely studied and applied. In the prior art, the devices for testing the performance parameters of thermoelectric materials are mainly designed for inorganic thermoelectric materials, and the samples to be tested are mostly hard blocks or thick sheets, which can be tested direct...

AI Technical Summary

Problems solved by technology

[0007] Based on the above analysis, the present invention aims to provide a device, method and system for testing the performance parameters of thin-film thermoelectric materials to solve one of the following technical problems: (1) the traditional thermoelectric performance parameter testing method is complicated to operate; (2) the traditional The test method of thermoelectric performance parameters is slow in test speed and low in test accuracy; (3) The traditional test method of thermoelectric performance parameters is difficult to meet the actual needs of fast and simple testing of a large number of thin film thermoelectric material performance parameters

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