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Universal analog-to-digital converter testing device

An analog-to-digital converter and test device technology, which is applied in the direction of analog/digital conversion calibration/testing, etc., can solve the problems of test channel parasitic parameters affecting performance indicators, difficult performance in performance testing, and high cost, so as to facilitate system management and maintenance. , low cost, easy to characterize the effect

Pending Publication Date: 2022-08-09
SHANGHAI HUALI INTEGRATED CIRCUTE MFG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] In order to be suitable for the evaluation of various types of analog-to-digital converters (ADC), such as Flash, SAR, Pipeline, Sigma Delta, etc., the general traditional test method is to use a general-purpose integrated automatic test system (ATE) test machine, this machine Mainly for wafer (Wafer) testing, such as Teradyne, UltraFlex, Advantest, and Agilent, although the architecture is common and the hardware is unified, but for high-precision and high-speed ADC testing, its performance testing is difficult to truly reflect the performance of the IP, because the general-purpose machine The hardware is unified. In order to cover the test items used, the test conditions of the hardware need to cover a wide range, and the cost is very high.
However, in some low-voltage, high-precision, and high-speed tests, the parasitic parameters of the general-purpose test channel will affect the performance indicators. If you switch to advanced probes and hardware configurations, the cost is very expensive

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0051] like figure 1 As shown, this embodiment provides a general analog-to-digital converter testing device, the testing device at least includes: an analog-to-digital converter test module 1, a plurality of test interface boards 2, a test motherboard 3, an external power supply, and a signal generator 5, and the logic analyzer 6, the analog-to-digital converter test module 1 is connected to the test interface board 2 and the test motherboard 3 in turn, the external power supply, the signal generator 5 and the logic analyzer 6 are connected to each other and are all connected to the analog-to-digital converter test module 1 .

[0052] like figure 1 As shown, the test device also includes a main control computer 7, which is connected with the test motherboard 3, the analog-to-digital converter test module 1, the external power supply, and the signal generator 5, And the main control computer 7 is also connected to the network server 8 and the data processing server 9 .

[005...

Embodiment 2

[0086] This embodiment provides a general analog-to-digital converter testing device, such as image 3 As shown, the difference between this device and the first embodiment is that the model and unit circuit of each unit in the analog-to-digital converter test module 1 are further enumerated.

[0087] like image 3 As shown, the analog-to-digital converter test module 1 includes a signal conditioning unit 11, a sine wave generator unit 12, an analog-to-digital converter 13, a multiplexing unit 14, a power management unit 15, a high-speed connector unit 16, and a module code 17. and standard sample unit 18.

[0088] The signal conditioning unit 11 is connected with the signal generator 5 and the sine wave generator unit 12, and is used to condition the signal output by the signal generator 5 or the sine wave generator unit 12, and output the signal to the module. digital converter 13. This system scheme adopts DDS sine wave generator, the scheme is simple and easy to control...

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Abstract

The invention provides a universal analog-to-digital converter testing device, which at least comprises an analog-to-digital converter testing module, a plurality of testing interface boards, a testing mainboard, an external power supply, a signal generator and a logic analyzer, and is characterized in that the analog-to-digital converter testing module is sequentially connected to the testing interface boards and the testing mainboard; the external power supply, the signal generator and the logic analyzer are connected and are all connected to the analog-to-digital converter test module. The testing device can work in a modularized and independent mode and is high in expandability, different functions can be achieved only through a simple building block building mode, each component can operate independently and can be formed in a spliced mode when needed, the more spliced module assemblies are, the stronger the achieved functions are, operation is easy, maintainability is good, and the testing device is suitable for popularization and application. And the test problem of the analog-to-digital converter in practice can be well solved.

Description

technical field [0001] The invention belongs to the field of chip testing, in particular to a general analog-to-digital converter testing device. Background technique [0002] In order to be suitable for the evaluation of various types of analog-to-digital converters (ADC), such as Flash, SAR, Pipeline, Sigma Delta, etc., the general traditional test method is to use a general integrated automatic test system (ATE) test machine. Mainly for wafer (Wafer) testing, such as Teradyne, UltraFlex, Advantest, Agilent, although the architecture is common, the hardware is unified, but for high-precision high-speed ADC testing, its performance test is difficult to truly reflect the performance of IP, because the general machine The hardware is unified, in order to cover the test items used, the hardware needs to cover a wide range of test conditions, and its cost is very high. However, in some low-voltage, high-precision, high-speed tests, the parasitic parameters of the common test c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/10
CPCH03M1/1071
Inventor 程景全沈淑娴
Owner SHANGHAI HUALI INTEGRATED CIRCUTE MFG CO LTD
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