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Long-distance scatterer microvibrating signal measurement and fidelit pickup interferometer

A signal measurement, long-distance technology, applied in vibration testing, measuring devices, measuring ultrasonic/sonic/infrasonic waves, etc., to achieve the effect of increasing the sensitivity limit, improving detection sensitivity, and reducing phase noise

Inactive Publication Date: 2005-11-16
安徽至博光电科技股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to avoid the deficiencies in the above-mentioned prior art, provide a method that can increase signal optical power, reduce system phase noise, and finally realize long-distance non-cooperative target micro-vibration signal measurement and fidelity pickup Micro-vibration signal measurement of long-distance scattered objects and fidelity pickup interferometer

Method used

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  • Long-distance scatterer microvibrating signal measurement and fidelit pickup interferometer
  • Long-distance scatterer microvibrating signal measurement and fidelit pickup interferometer
  • Long-distance scatterer microvibrating signal measurement and fidelit pickup interferometer

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Embodiment Construction

[0016] see figure 1 In this embodiment, the fiber laser 1 is used as the light source, and the telescopic system 6 is used to focus the laser light onto the vibrating target 13. The scattered light is signal light, and then the telescopic system 6 converges the signal light.

[0017] The specific optical path is: the output of the fiber laser 1 passes through the polarization-maintaining fiber 2 and the collimator 3 to the A polarization beam splitter 4 with a parallel beam, and then, one way passes through the λ / 4 wave plate 5 to project the telescopic system 6, and the other One path as local reference light is reflected back to A polarization beam splitter 4 through λ / 4 wave plate 8 and reflector 7; the signal light and local reference light collected by telescopic system 6 pass through A polarization beam splitter 4, and first pass through The half-wave plate 9 rotates the polarization directions of the signal light and the reference light by 45 degrees at the same time, a...

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Abstract

The present invention is interferometer for remotely measuring and orthoscopically picking-up microvibration signal of scattering matter. After the light from fiber laser as light source is passed through the fiber and collimator and split in the polarizing light splitter, one light beam is passed through the quarter wave plate, jetted from the outgoing telescope system and focused onto the remote target to obtain scattered light as signal light; the other light beam as the local reference beam is passed through the quarter wave plate, reflected by the reflector and returned to the polarizing light splitter; and the telescope system collected signal light beam and the local reference beam are passed through the polarizing light splitter, half-wave plate and one other polarizing light splitter to the optoelectronic deterctor D1 and D2 to obtain the interference signals separately. The present invention has high light source power utilization and low systemic phase noise.

Description

Technical field: [0001] The invention relates to a non-contact laser vibrometer technology, more specifically to a device for measuring and fidelity picking up micro-vibration signals of long-distance scattered objects. Background technique: [0002] Both the measurement and fidelity pickup of the vibration signal can use Doppler (Doppler) interferometry. Near-distance non-contact detection generally adopts two-beam interference and self-mixing technology, and the amplitude accuracy has reached the sub-nanometer level. When the detection distance is long, the reference light Michelson (Michelson) interferometry technology is generally used, but when the measurement distance is long (such as greater than 25 meters), it is often necessary to install a cooperative target on the surface of the measured object to increase the intensity of the return light. [0003] In some practical applications, due to environmental constraints, the measurement equipment must be far away from t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B9/02G01M7/02
Inventor 俞本立吴海滨苏坤杨青甄胜来曹志刚
Owner 安徽至博光电科技股份有限公司