Method and system for lowering action of soft error caused by radiation

A soft error and soft error rate technology, applied in the field of soft error sensitivity, can solve the problems of chip noise interference and chip space occupation

Inactive Publication Date: 2004-03-10
IBM CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

These cells take up valuable chip real estate and can also themselves be disturbed by normal chip noise

Method used

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  • Method and system for lowering action of soft error caused by radiation
  • Method and system for lowering action of soft error caused by radiation
  • Method and system for lowering action of soft error caused by radiation

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Embodiment Construction

[0019] The present invention generally provides a method and system for altering the soft error susceptibility of memory circuits. In a preferred embodiment, an efficient model (combining cosmic magnetic flux input, chip geometry, and calculation of energy deposition and charge collection due to particles of protons, neutrons, muons, etc.) is used to treat SER (soft error rate) as Estimated as a function of location (including latitude, longitude, and altitude). The model generates a database in the form of a library of lookup tables that can also include annual sunspot activity data, changes in Earth's magnetic field, and any known radioactive sources. This information can be accessed using an external chip source such as GPS. The GPS will identify the chip location, and the FIT rate for that location can be quickly determined by reading the data in the lookup table. Depending on the FIT level, the computer can switch to a less soft-error-sensitivity mode.

[0020] Alterna...

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Abstract

A method and system for mitigating the impact of radiation induced in a data processor incorporating integrated circuits. The method comprises the steps of determining the location of the data processor, determining a set of radiation sources and intensities at that location, and estimating the soft error rate of the data processor as a function of the determined radiation intensities and geometric characteristics of said integrated circuits to provide an estimate value. The data processor is modified (either hardware or software) in response to the estimate value at times the estimate value exceeds a predetermined value.

Description

technical field [0001] The present invention relates generally to integrated memory circuits and, more particularly, to altering the soft error susceptibility of electronic components. Background technique [0002] Soft errors in the operation of an integrated circuit or in the program running on that circuit are caused by transient events such as chip noise, wire-to-wire induction, and radiation effects. Typically, any particular soft error does not repeat itself, and the program may be equipped with procedures or hardware to correct these errors. For example, when an error is detected, the program can jump back some steps and then repeat those steps. [0003] The susceptibility of a particular circuit to soft errors can vary depending on various circumstances including the actual location of the circuit. One reason for this is that radiation effects such as protons, neutrons, muons, etc. can vary greatly with location and time such as the 11-year cycle of the solar cycle...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04L1/00
CPCH04L1/0001
Inventor 肯尼斯·P·罗德贝尔汉瑞·H·K·唐罗伯特·M·特瑞普黄志宽
Owner IBM CORP
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