Timing adjust circuit,drive circuit,electric light device and electronic apparatus

Abstract

PURPOSE: An apparatus for inspecting insulation layer of PDP panel is provided to inspect a quality or a spreading state of dielectric substance through a large territory by a nondestructive inspection with non-contact probe. CONSTITUTION: An apparatus for inspecting insulation layer of PDP panel comprises a first short bar(50) and a second short bar(55) to apply a standard voltage to all bus electrode of a PDP panel, a capacitance nearing sensor probe(60) for scanning a top part of a dielectric substance formed on the bus electrode in a non-contact method and outputting the change between the bus electrodes according to a change of a dielectric constant and a thickness of the dielectric substance as a voltage value using a capacitance, and a control part(90) for controlling the capacitance nearing sensor probe as well as deciding a state of the dielectric substance by the output voltage of the capacitance nearing sensor probe.

Description

technical field [0001] The present invention relates to a medium inspection device of a PDP panel, specifically, the medium inspection device of the PDP panel involved is to check the uniformity and quality of the medium formed on the upper glass of the PDP panel by using the method of testing the electrostatic capacitance The non-contact electrostatic capacitance proximity sensor probe performs non-destructive inspection and can check the coating state and quality of media in a wide area. technical background [0002] Image display devices used in recent years include cathode ray tubes (CRTs), liquid crystal display devices (LCDs) of flat panel display devices, plasma display panels (PDPs), and the like. [0003] Among these image display elements, cathode ray tubes have outstanding performance compared with other elements in terms of image quality and brightness. However, it has a disadvantage that it is not suitable for large screens due to its bulkiness and weight. [...

AI Technical Summary

Problems solved by technology

[0017] However, in this method, after forming 40 to 50 upper plates as a sample inspection, sample grooves are formed for inspection of each medium, and products with sample grooves formed cannot be used after inspection.

In the past, the physical damage inspection method of etching the dielectric formed on the upper plate and forming a sample groove to test the thickness of the dielectric was used, so the product after the inspection of the dielectric could not be used, so compared with the full inspection, there was a problem of low yield.

[0018] After the sample groove is formed on the upper plate, in order to test only the thickness of the sample groove, when the thickness is the same, the material of the dielectric is not uniform, and there is a problem that the variable dielectric constant cannot be measured.

[0019] In a wide upper plate, multiple sample grooves are formed at arbitrary positions, and in order to judge the entire upper plate, there is a problem that it is necessary to use partial data to judge the whole

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