Temp. checking circuit unsensing for change of supply voltage and temp

A temperature detection circuit and voltage technology, which is applied in the direction of thermometers, thermometers, and measuring devices that use electrical/magnetic components directly sensitive to heat, can solve the problems of temperature detection circuit power supply voltage and sensitivity to changes in semiconductor processes, and achieve protective operation Effect

Inactive Publication Date: 2004-08-04
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, conventional temperature sensing circuits are often sensitive to supply voltage and semiconductor process variations

Method used

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  • Temp. checking circuit unsensing for change of supply voltage and temp
  • Temp. checking circuit unsensing for change of supply voltage and temp
  • Temp. checking circuit unsensing for change of supply voltage and temp

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Embodiment Construction

[0018] Reference will now be made in detail to the preferred embodiments of the invention, examples of which are illustrated in the accompanying drawings. However, the present invention is not limited to the embodiments described herein, and the embodiments herein are provided to provide an easier and more comprehensive understanding of the scope and essence of the present invention. Wherever possible, the same reference numbers will be used in the drawings to refer to the same or similar parts.

[0019] figure 1 A temperature detection circuit according to an embodiment of the present invention is shown. refer to figure 1 , the temperature detection circuit 100 includes a bandgap reference voltage generator 110 , an operational amplifier 115 , a reference current generator 120 , a temperature detection voltage generator 130 and a comparator 140 . The temperature detection circuit 100 is manufactured using a CMOS process. The bandgap reference voltage generator 110 generat...

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Abstract

A temperature detection circuit comprises an OP amp, a reference current generator, a temperature detection voltage generator, a comparator, and a band gap reference voltage generator. The OP amp receives a band gap reference voltage and a first voltage. The reference current generator generates the first voltage and a reference voltage in response to an output signal of the OP amp. The temperature detection voltage generator generates a temperature detection voltage in response to an ambient temperature and the output signal of the OP amp. The comparator compares the reference voltage with the temperature detection voltage to generate a temperature control signal. The band gap reference voltage generator generates the band gap reference voltage. Accordingly, the temperature detection circuit of the present invention can perform high or low temperature detection stably in supply voltage and temperature variations and thus protect the operation of the integrated circuit.

Description

technical field [0001] The present invention relates to a semiconductor integrated circuit, and more particularly, to a temperature detection circuit insensitive to changes in power supply voltage and temperature. Background technique [0002] Many manufacturing processes implement temperature monitoring for process control, and microcontrollers or microprocessors use the method of measuring temperature in digital form. Integrated circuits (ICs) typically measure temperature without the use of external components, but directly read the temperature in digital form. This IC temperature detector can be embedded in other integrated circuits. [0003] Typically, ICs have a predetermined operating temperature range beyond which errors, including device failure, can occur. In order to ensure that the IC will not work outside the predetermined operating temperature range, a temperature detector is configured inside the IC. If the temperature of the IC exceeds a predetermined temp...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C7/04G01K3/00G01K7/01
CPCG01K3/005G01K7/01G11C7/04
Inventor 金灿容
Owner SAMSUNG ELECTRONICS CO LTD
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