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Double monochromatic spectroscopic device

一种分光镜、单色的技术,应用在光学元件、光谱测定法/分光光度测定法/单色器、仪器等方向,能够解决影响分光镜器件性能、没有讲述波长的校准等问题,达到时间和劳动量缩短、低成本、提高生产率的效果

Active Publication Date: 2005-04-06
SHIMADZU SEISAKUSHO CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The above various errors have seriously affected the performance of the spectroscopic device
[0008] The above-mentioned JP-A-8-136344 discloses the structure of this spectroscopic device, but does not describe the calibration of the wavelength

Method used

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Examples

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Embodiment Construction

[0028] Figure 1A It is an optical system diagram of a double monochromatic beam splitter device of an embodiment of the present invention, Figure 1B is a perspective view of the arrangement of the main components.

[0029] from Figure 1A As can be seen in the figure, the beam splitter device 30 according to this embodiment includes a pre beam splitter and a main beam splitter. The front beam splitter is a Monk-Gyreeson type beam splitter, including a concave mirror 31 and a concave diffraction grating 32 . The main beam splitter is a Czerny-Turner beam splitter, including two concave mirrors 33a, 33b and a plane diffraction grating 34 . The entrance slit 35 is provided on the light incident side of the diffraction grating 32 of the pre-beam splitter. A middle slit 36 ​​(also used as an entrance slit of the main beam splitter) is provided on the light exit side of the diffraction grating 32 of the front beam splitter. The exit slit 15 is provided on the light exit side ...

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Abstract

Detected and stored are zero-order light positions which are an angular position of the pre-spectroscope and that of the main spectroscope at which a main light ray incident on the inlet slit reaches the outlet slit via the pre-spectroscope and the main spectroscope. In a state where the main spectroscope is located at its zero-order light position, the pre-spectroscope is rotated to detect the angular position of the pre-spectroscope for a predetermined wavelength. Further, in a state where the pre-spectroscope is located at its zero-order light position, the main spectroscope is rotated to detect the angular position of the main spectroscope for the predetermined wavelength.

Description

technical field [0001] The present invention relates to a double monochromatic beam splitter device, more specifically, relates to a wavelength calibration mechanism and method for a pre-beam splitter and a main beam splitter in the double monochromatic beam splitter device. Background technique [0002] image 3 A typical wavelength scanning mechanism in a conventional double monochromator beamsplitter device is shown. The wavelength scanning mechanism 10 includes a front beam splitter 11 with a diffraction grating and a main beam splitter 12 with a diffraction grating. The entrance slit 13 is provided on the light incident side of the diffraction grating of the pre-beam splitter 11 . A middle slit 14 (also used as an entrance slit of the main beam splitter 12 ) is provided on the light output side of the diffraction grating of the front beam splitter 11 . An exit slit 15 is provided on the light output side of the main beam splitter 12 . Light from the light source pass...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/06G01J3/18
CPCG01J2003/1814G01J3/18
Inventor 原田克己
Owner SHIMADZU SEISAKUSHO CO LTD
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