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Multiband comprehensive photoelectric properties field on-line measurement device

A technology of optoelectronic performance and measuring device, which is applied in the direction of testing optical performance, etc., can solve the problems of online measurement that cannot be applied to field optoelectronic systems, and the equipment is cumbersome, so as to achieve the effect of improving work efficiency and automation, improving measurement accuracy and improving measurement accuracy.

Inactive Publication Date: 2005-06-29
ORDNANCE TECH RES INST OF THE GENERAL ARMAMENT DEPT PLA
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Problems solved by technology

Although the degree of automation and intelligence of these instruments has been greatly improved, they are still single-band performance tests, and the white light performance test has not fundamentally realized the full automation of the simulation of the target scene and the collection, processing and output of test results. Moreover, the equipment is heavy and cannot be applied to On-line measurement of field photoelectric system

Method used

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  • Multiband comprehensive photoelectric properties field on-line measurement device

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Embodiment Construction

[0015] As shown in the accompanying drawings, the measuring device of the present invention is composed of a white shimmering reticle target light source 1a and an illumination contrast connected with a pattern scanning control circuit 1b to form an intelligent program-controlled reticle 1; it is connected by an area source blackbody target light source 2a and a temperature difference control circuit 2b to form an infrared target generator 2; the infrared point target is connected with a laser pulse light field simulation light source 3a and a power control and coding control circuit 3b to form an infrared point light source and a laser light field simulation emitter 3. The intelligent program-controlled reticle 1, the infrared target generator 2, the infrared point light source and the laser light field simulation transmitter 3 are respectively connected with the Cassegrain collimator 6 supported and connected on the support work frame 5. The control circuits of each target li...

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Abstract

This invention discloses a multi-wave band photoelectricity field on-line test device and comprises the following structure: to connect the white weak light division object and shining and comparing and pattern-scanning control circuit to form intelligent program control division board; to connect face source black object with temperature difference control circuit to form infrared target generator; to connect infrared spot object and laser impulse field analogue light source and power control and code control circuit to form infrared spot light source and laser field analogue emitter. The control circuit of the above three parts are separately connected to the engineer unit series ports and there locates a circuit interface of photoelectricity system of the light to be measured to reflect the result.

Description

technical field [0001] The invention relates to a device for comprehensive testing of optical performance of an optical system, in particular to a device for field on-line measurement of multi-band comprehensive photoelectric performance. Background technique [0002] At present, most of the instruments and equipment used for photoelectric performance measurement are single parameters or comprehensive measurements of the same band, which are not only large in size and quality, but low in intelligence, and are mostly used in laboratories. From the 1970s to the mid-1980s, a series of transfer function measuring instruments were successively developed internationally, such as the EROS series transfer function measuring instrument of the British company Ealing 8L Beck, and the MTF measuring instrument of the American Tropel company. instrument, my country's GCH-1 letter transfer instrument and so on. These are measuring instruments for single parameters in the white light band. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
Inventor 陈志斌龙书林卓家靖
Owner ORDNANCE TECH RES INST OF THE GENERAL ARMAMENT DEPT PLA
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