Copper wire and method of manufacturing the same
a technology of copper wire and copper wire, which is applied in the field of copper wire, can solve the problems of low weldability of oxygen-free copper, low half-softening temperature, and poor toughness of copper wire, and achieve the effect of high tensile strength
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Benefits of technology
Problems solved by technology
Method used
Image
Examples
embodiment
[0037]The copper wire in the present embodiment is formed of a copper wire rod containing Ti at a concentration of 5 to 55 mass ppm, sulfur at a concentration of 3 to 12 mass ppm, oxygen at a concentration of 2 to 30 mass ppm and the balance consisting of copper and inevitable impurities. Note that, the inevitable impurity means a substance inevitably mixed during the production process.
[0038]The copper wire has a first crystal and a second crystal. The first crystal has a crystal orientation and includes at least one twin crystal therein. The second crystal is one or more crystals adjacent to the first crystal, has a [111] crystal orientation provided by rotating the atomic plane at a different angle from the first crystal and includes at least one twin crystal therein. The first or second crystal is not more than 100 μm in size and the twin crystals therein are formed at a distance of not less than 0.1 mm and not more than 0.5 mm.
[0039]The copper wire has a conductivity of not les...
example 1
[0073]As shown in FIG. 1, it can be confirmed that crystal grains 1a and 1b in the crystal structure of Example 1 are larger than crystal grains 1 in Comparative Examples 1 to 3 shown in FIGS. 2 to 4. It can be also confirmed that the formation direction of twin crystal is different between a twin crystal 2a in the crystal grain 1a and a twin crystal 2b in the crystal grain 1b and that a rotated angle of the atomic plane is different between the crystal grains 1a and 1b. It can be confirmed that a distance between twin crystals formed in the crystal structure is not less than 0.1 mm and not more than 0.5 mm.
[0074]In Example 1, an x-ray diffraction peak is observed only from the (111) plane and is not observed from any of the (200), (220) and (311) planes, as shown in FIG. 5. This confirms that a percentage of planes in the [111] crystal orientation is substantially 100% in the copper wire of Example 1.
PUM
| Property | Measurement | Unit |
|---|---|---|
| Temperature | aaaaa | aaaaa |
| Temperature | aaaaa | aaaaa |
| Temperature | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
Login to View More 


