Controlling dry etch process characteristics using waferless dry clean optical emission spectroscopy

Abstract

Described herein are architectures, platforms and methods for acquiring optical emission spectra from an optical emission spectroscopy system by flowing a dry cleaning gas into a plasma processing chamber of the plasma processing system and igniting a plasma in the plasma processing chamber to initiate the waferless dry cleaning process.

Description

RELATED APPLICATIONS[0001]This application is based on and claims priority to U.S. Provisional Patent Application No. 61 / 316,021, entitled “METHOD FOR CONTROLLING DRY ETCH PROCESS CHARACTERISTICS USING WAFERLESS DRY CLEAN OPTICAL EMISSION SPECTROSCOPY” (Ref. No. TEA-136US1-PRO), filed on Mar. 31, 2016.BACKGROUND[0002]One of the problems with dry etch processes for via and trench features is the variation in the etch profile during the processing of a full lot of wafers. This may be due to the build-up of carbon (C) and fluorine (F) (collectively referred to as CF)-based etch gas constituents used for passivation and etch selectivity, which are used to form specific etch profiles for patterned wafers in semiconductor processing. If these constituents are not effectively removed from the chamber to the same degree during dry clean cycles between wafers, polymer deposition can accumulate in a chamber leading to the build-up of a film layer which can lead to particle formation and peeli...

AI Technical Summary

Benefits of technology

This patent describes a way to make sure that different wafers in a cleaning process are getting the same level of cleaning. This is done by measuring the light that is emitted during the process. By monitoring and controlling these light emissions, the process can be optimized to make sure that no damage is being done to the wafers during the clean. This technology helps ensure consistent results across different wafers.

Problems solved by technology

One of the problems with dry etch processes for via and trench features is the variation in the etch profile during the processing of a full lot of wafers.

If these constituents are not effectively removed from the chamber to the same degree during dry clean cycles between wafers, polymer deposition can accumulate in a chamber leading to the build-up of a film layer which can lead to particle formation and peeling, and can generate defects and device failure on a wafer.

In addition, ineffective or inconsistent waferless dry cleaning (WLDC) of the chamber between device wafers, can lead to varying residual CF constituents in the chamber, which subsequently are introduced during a successive dry etch process of a device wafer that affects the uniformity of etch profile characteristics from one wafer lot to the next.

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