Triple modular redundancy flip-flop with improved power performance area and design for testability

Abstract

A triple modular redundancy (TMR) flip-flop includes a set of master-gate-latch circuits including a first set of inputs to receive a first digital signal, and a second set of inputs to receive a clock; and a voting logic circuit including a set of inputs coupled to a set of outputs of the set of master-gate-latch circuits, and an output to generate a second digital signal based on the first digital signal. Another TMR flip-flop includes a set of master-gate-latch circuits to receive a set of digital signals in response to a first edge of a clock, respectively; and latch the set of digital signals in response to a second edge of the clock, respectively; and a voting logic circuit to receive the latched set of digital signals; and generate a second digital signal based on a majority of logic levels of the latched first set of digital signals, respectively.

Description

FIELD[0001]Aspects of the present disclosure relate generally to data flip-flops, and in particular, to a triple modular redundancy flip-flop with improved power performance area (PPA) attributes and design for testability (DFT) capability.DESCRIPTION OF RELATED ART[0002]Data flip-flops are used in computing circuits to sequentially deliver data through various sub-circuits and combinational logic. The data retained by the flip-flops during the sequential delivery may be affected by noise, such as terrestrial radiation. For example, terrestrial radiation directed at a node of a flip-flop may cause the flip-flop to unintendedly change state or flip (e.g., from a logic one (1) to a logic zero (0), or vice-versa). This is sometimes referred to as a single event upset (SEU). If such flip-flops are employed in safety-related systems, such as automotive or avionics systems, the consequence of an unintended change in the state of one or more flip-flops (e.g., one or more SEUs) may severely...

AI Technical Summary

Problems solved by technology

The data retained by the flip-flops during the sequential delivery may be affected by noise, such as terrestrial radiation.

If such flip-flops are employed in safety-related systems, such as automotive or avionics systems, the consequence of an unintended change in the state of one or more flip-flops (e.g., one or more SEUs) may severely compromise the safety of humans relying on such systems.

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