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Infrared-modulated photoluminescence spectrum measuring method and apparatus based on step scan

A technology of luminescence spectroscopy and step-scanning, used in fluorescence/phosphorescence, material excitation analysis, optical testing flaws/defects, etc., it can solve the problem that the Fourier transform frequency cannot be clearly separated from the excitation light modulation frequency, which limits the reliability and scope of application. , low spectral resolution, etc., to achieve the effect of strong background radiation suppression performance, shortened time required, and high detection sensitivity

Active Publication Date: 2008-10-08
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

Unfortunately, both methods are fundamentally limited by the inherent inability of the FTIR fast scan method to cleanly separate the Fourier transform frequency from the excitation light modulation frequency
In addition, when the spectral resolution is not high (such as 12cm -1 ) In the case of ), the experimental process is already quite long (it usually takes several hours to collect a PL spectrum with an acceptable signal-to-noise ratio)
severely limit their reliability and applicability

Method used

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  • Infrared-modulated photoluminescence spectrum measuring method and apparatus based on step scan
  • Infrared-modulated photoluminescence spectrum measuring method and apparatus based on step scan
  • Infrared-modulated photoluminescence spectrum measuring method and apparatus based on step scan

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Embodiment Construction

[0023] The following is based on figure 1- image 3 The preferred embodiments of the present invention are given and described in detail to better illustrate the technical features and functional features of the present invention, rather than to limit the scope of the present invention.

[0024] refer to figure 1, In fact, in Figure 1 Toggle DPDT coaxial linkage switch K 1 , K 2 , two different working modes are about to be given, one is to use the existing Fourier transform infrared spectroscopy system 1, that is, only the original Fourier transform infrared spectrometer 10 and the matching Fourier transform infrared spectroscopy processing computer 20 are used, The sample 4 is continuously scanned for PL spectrum measurement. The pump laser light emitted by the laser 3 directly excites the sample 4 to generate a PL spectrum. In the continuous moving (scanning) mode, the photoluminescent signal of the sample 4 is sent to the detector 103 through the optical interferen...

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Abstract

The invention relates to a method and apparatus of infrared modulation photo-induced luminous spectrum based on step scan. The apparatus comprises a Fourier transform infrared spectrograph measuring system, a laser used as active light source, a lock-in amplifier which connects the Fourier transform infrared spectrograph detector and the circuit controlling plate and a circuit-breaker on the light path between the sample and the laser, so that it can transfer the constant active light into the modulated active light and feedback it in the reference end of the lock-in amplifier to control the lock-in.

Description

technical field [0001] The invention relates to a method and device for testing the weak photoluminescence characteristics of middle and far infrared optoelectronic materials, specifically, a method for measuring the modulated photoluminescence spectrum based on the step-scan function of a Fourier transform infrared (FTIR) spectrometer and device. Background technique [0002] Photoluminescence (PL) spectroscopy, as a classic and very effective method for non-destructive testing of semiconductor materials, is widely used in the study of optical properties of wide-bandgap semiconductors such as III-V groups, which greatly improves the understanding of the photoelectric properties of related materials. Thanks to the advantages of multi-channel and high luminous flux of Fourier transform (FT) infrared spectrometer, FT-PL has been successfully applied in fields where traditional monochromatic spectroscopic measurement is almost impossible. But in the mid- and long-wave infrared...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/64G01N21/88
Inventor 邵军陆卫吕翔越方禹郭少令李志锋褚君浩
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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