Method for fabricating a CMOS image sensor
A technology of image sensor and manufacturing method, which is applied in semiconductor/solid-state device manufacturing, electric solid-state device, semiconductor device and other directions, and can solve the problems of complex manufacturing process, CCD cannot be applied to small products, complex driving mode, etc.
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[0018] Hereinafter, a method of manufacturing a CMOS image sensor according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings. Figure 2 to Figure 7 is a cross-sectional view schematically illustrating a method of manufacturing a CMOS image sensor according to various embodiments.
[0019] Such as figure 2 As shown, an active region and an isolation region are defined in a semiconductor substrate, and an isolation layer is formed in the isolation region by a shallow trench isolation (STI) process. Thereafter, a gate oxide is grown in the active region, and a conductive layer (such as a high-concentration polysilicon layer) is deposited on the semiconductor substrate. Then, part of the conductive layer and the gate oxide are selectively removed by a photolithography-etching process, thereby forming first and second gates 103 and 104 separated by a certain distance in the active region of the semiconductor substra...
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